@misc{1337951,
  author = {David W. Flater},
  title = {Screening for factors affecting application performance in profiling measurements},
  year = {2014},
  month = {2014-10-30 00:10:00},
  publisher = {Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.TN.1855},
  language = {en},
}