@article{133581,
  author = {Jason Campbell and Kin Cheung and John Suehle},
  title = {New Insight into NBTI Transient Behavior Observed from Fast-GM Measurements},
  year = {2008},
  number = {29},
  month = {2008-09-01},
  publisher = {Electron Device Letters},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32968},
  language = {en},
}