@misc{1335591,
  author = {Lawrence T. Hudson and Jack Leigh Glover and Ronaldo Minniti},
  title = {The Metrology of a Rastered Spot of X Rays used in Security Screening},
  year = {2014},
  number = {119},
  month = {2014-11-06 00:11:00},
  publisher = {Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916722},
  doi = {https://doi.org/10.6028/jres.119.021},
  language = {en},
}