@conference{1334706,
  author = {Jason Ryan and Liangchun Yu and Jae Han and Joseph J. Kopanski and Kin Cheung and Fei Zhang and C Wang and Jason Campbell and John Suehle and Vinayak Tilak and Jody Fronheiser},
  title = {A New Interface Defect Spectroscopy Method},
  year = {2011},
  month = {2011-04-12 00:04:00},
  publisher = {Proceedings of the IEEE International Reliability Physics Symposium, Monterey, CA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907880},
  doi = {https://doi.org/10.1109/irps.2011.5784477},
  language = {en},
}