@article{1312186,
  author = {Ory Maimon and Neil Moser and Pragya Shrestha and Minyeong Kim and Sang-Mo Koo and Kyle Liddy and Andrew Green and Kelson Chabak and Sujitra Pookpanratana and Qiliang Li},
  title = {Impact of Deep-Level Traps on Carrier Mobility in β-Ga2O3 MOSFETs},
  year = {2026},
  number = {73},
  month = {2026-04-07 04:04:00},
  publisher = {IEEE Transactions on Electron Devices},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959460},
  doi = {https://doi.org/10.1109/TED.2026.3678479},
  language = {en},
}