@article{1306231,
  author = {Kin Cheung and Yu Xin Wen and Bing-Yue Tsui},
  title = {On the Response Time Constant of Interface Defects in Accumulation},
  year = {2025},
  number = {26},
  month = {2025-11-21 05:11:00},
  publisher = {IEEE Transactions on Device and Materials Reliability},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958872},
  doi = {https://doi.org/10.1109/TDMR.2025.3635880},
  language = {en},
}