@article{1287601,
  author = {Olga Ridzel and Glenn Holland and John Villarrubia},
  title = {Measurements of Secondary Electron Yield for Validation of Scanning Electron Microscopy Models},
  year = {2025},
  number = {31 },
  month = {2025-07-25 04:07:00},
  publisher = {Microscopy and Microanalysis},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959621},
  doi = {https://doi.org/10.1093/mam/ozaf048.265},
  language = {en},
}