@conference{1287596,
  author = {Vladimir Oleshko and Glenn Holland and Daron Westly and John Villarrubia},
  title = {Large Area Real-Space Crystallography and Thickness Determination of Mesoscopic Semiconductor Membranes Using Zone Axis Patterns, Cold Field-Emission SEM/STEM, and Analytical S/TEM},
  year = {2025},
  number = {31},
  month = {2025-07-25 04:07:00},
  publisher = {Microscopy & Microanalysis 2025, Proceedings of the MSA/MAS Annual Meeting, July 27-31, 2025, Salt Lake City, Utah, Slat Lake City, UT, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959536},
  doi = { https://doi.org/10.1093/mam/ozaf048.272},
  language = {en},
}