@article{1285666,
  author = {Yu Xin Wen and Bing-Yue Tsui and Kin Cheung},
  title = {Impact of near interface defects on NO annealed SiC MOSFET mobility},
  year = {2025},
  number = {173},
  month = {2025-07-02 04:07:00},
  publisher = {Microelectronics Reliability},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959480},
  doi = {https://doi.org/10.1016/j.microrel.2025.115841},
  language = {en},
}