@conference{12456,
  author = {Chukwudi Okoro and Lyle Levine and Yaw Obeng and Klaus Hummler and Ruqing Xu},
  title = {X-Ray Micro-Beam Diffraction Measurement of the Effect of Thermal Cycling on Stress in Cu TSV: A Comparative Study},
  year = {2014},
  month = {2014-05-26},
  publisher = {Proceeding of IEEE Electronic Components and Technology Conference (ECTC), Lake Buena Vista, FL},
  language = {en},
}