@article{1238176,
  author = {Albert Davydov and Yaw S. Obeng and Ndubuisi George Orji and Umberto Celano and Daniel Schmidt and Carlos Beitia},
  title = {Metrology for 2D materials: a perspective review from the international roadmap for devices and systems},
  year = {2024},
  month = {2024-04-08 04:04:00},
  publisher = {Nanoscale Advances},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=956896},
  doi = {https://doi.org/10.1039/D3NA01148H},
  language = {en},
}