@conference{1218681,
  author = {Mehdi Dadfarnia and Michael Sharp and Timothy Sprock},
  title = {Understanding and Evaluating Naive Diagnostics Algorithms Applicable in Multistage Manufacturing from a Risk Management Perspective},
  year = {2020},
  month = {2020-06-21 04:06:00},
  publisher = {ASME Manufacturing Science and Engineering Conference 2020 (MSEC 2020), Cincinnati, OH, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929363},
  doi = {https://doi.org/10.1115/MSEC2020-8430},
  language = {en},
}