@conference{1207206,
  author = {Kin (Charles) Cheung},
  title = {V-Ramp test and gate oxide screening under the "lucky" defect model},
  year = {2023},
  month = {2023-05-15 04:05:00},
  publisher = {2023 IEEE International Reliability Physics Symposium, Monterey, CA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935744},
  doi = {https://doi.org/10.1109/IRPS48203.2023.10118184},
  language = {en},
}