@misc{1196986,
  author = {Brian G Rennex},
  title = {Standard Reference Materials ::Certification of a standard reference material for the determination of interstitial oxygen concentration in semiconductor silicon by infrared spectrophotometry/},
  year = {1994},
  month = {1994-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.SP.260-121},
  language = {en},
}