@misc{1183176,
  author = {F F Oettinger},
  title = {Measurement techniques for high power semiconductor materials and devices ::annual report, October 1, 1977 to September 30, 1978},
  year = {1979},
  month = {1979-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.IR.79-1756},
  language = {en},
}