@misc{1171921,
  author = {R R Stromberg and E Passaglia},
  title = {Ellipsometry in the measurement of surfaces and thin films ::symposium proceedings Washington 1963/},
  year = {1964},
  month = {1964-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.MP.256},
  language = {en},
}