@misc{1158686,
  author = {M L Crawford},
  title = {Using a TEM cell for EMC measurements of electronic equipment:},
  year = {1981},
  month = {1981-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.TN.1013},
  language = {en},
}