@misc{1155106, author = {W Murray Bullis}, title = {Methods of measurement for semiconductor materials, process control, and devices, quarterly report, January 1 to March 31, 1969.:}, year = {1969}, month = {1969-01-01 05:01:00}, publisher = {, National Institute of Standards and Technology, Gaithersburg, MD}, doi = {https://doi.org/10.6028/NBS.TN.488}, language = {en}, }