@misc{1130451, author = {Y May Chang}, title = {Error analysis and calibration uncertainty of capacitance standards at NIST:}, year = {2000}, month = {2000-01-01 05:01:00}, publisher = {, National Institute of Standards and Technology, Gaithersburg, MD}, doi = {https://doi.org/10.6028/NIST.SP.250-52}, language = {en}, }