@misc{1130091,
  author = {Carlos R Beauchamp and Johanna E Camara and Jennifer Carney and Steven J Choquette and Kenneth D Cole and Paul C DeRose and David L Duewer and Michael S Epstein and Margaret C Kline and Katrice A Lippa and Enrico Lucon and Karen W Phinney and Maria Polakoski and Antonio Possolo and Katherine E Sharpless and John R Sieber},
  title = {Metrological tools for the reference materials and reference instruments of the NIST material measurement laboratory:},
  year = {2020},
  month = {2020-07-01 04:07:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NIST.SP.260-136-2020},
  language = {en},
}