@conference{11291,
  author = {Ndubuisi Orji and Ronald Dixson and Hiroshi Itoh and Chumei Wang},
  title = {Technique for AFM Tip Characterization},
  year = {2014},
  month = {2014-09-15},
  publisher = {SPIE Proc. Instrumentation, Metrology, and Standards for Nanomanufacturing Vol. 9173, San Diego, CA},
  language = {en},
}