@conference{11251,
  author = {Benjamin Tsai and D DeWitt and E Early and Leonard Hanssen and Sergey Mekhontsev and Matthias Rink and Kenneth Kreider and B Lee and Zhuomin Zhang},
  title = {Emittance Standards for Improved Radiation Thermometry During Thermal Processing of Silicon Materials},
  year = {2004},
  month = {2004-06-22},
  publisher = {Proceedings 9th International Symposium on Temperature and Thermal Measurements in Industry and Science, Dubrovnik, CR},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841831},
  language = {en},
}