@conference{111411,
  author = {Jason Campbell and Jin Qin and Kin Cheung and Liangchun Yu and John Suehle and A Oates and Kuang Sheng},
  title = {The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs},
  year = {2008},
  month = {2008-10-17},
  publisher = {2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe, NV},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33210},
  language = {en},
}