@article{111136,
  author = {Eric Vogel and Monica Edelstein and John Suehle},
  title = {Reliability of Ultra-Thin Silicon Dioxide Under Substrate Hot-Electronic, Substrate Hot-Hole, and Tunneling Stress},
  year = {2001},
  month = {2001-11-01},
  publisher = {Microelectronic Engineering},
  language = {en},
}