Monolayer Formation on Semiconductor and Gold Surfaces for Molecular Electronics
Christina A. Hacker1, Kelly A. Anderson2, James D. Batteas3, Jayne C. Garno3, Curt A. Richter1, Lee J. Richter3, Christopher D. Zangmeister4, and Roger D. van Zee4
1Semiconductor Electronics Division, EEEL, NIST, Gaithersburg, MD 20899
2Department of Chemical Engineering, University of Maryland, College Park, MD 20742
3Surface and Microanalysis Science Division, CSTL, NIST, Gaithersburg, MD 20899
4Process Measurements Division, CSTL, NIST, Gaithersburg, MD 20899
The scale of electronic components has continued to shrink approaching the fundamental limits of fabrication, processing, and even bulk device physics. To address these limitations, molecular electronics has been proposed as a potential next-generation strategy where a single molecule or monolayer of molecules is the active component of the electronic device. Advancement of molecular electronics-based systems requires the ability to achieve reliable and precise measurements of conductance and charge transport in molecular electronic test structures.
Fabrication of valid test structures includes selection and purification of organic molecules, fabrication and thorough characterization of chemically bonded monolayers, and careful design and characterization of electronic test structures. As the electrical behavior of molecules depends on the structure, organization, and orientation within films, this poster addresses the second of these issues, formation and characterization of organic monolayers on conducting substrates.
Attachment of organic molecules to metal and semiconductor surfaces is distinctly different. Solution-based attachment of aliphatic and aromatic molecules to hydrogen-terminated Si(111) surfaces and Au(111) surfaces will be discussed. The physical and chemical properties of the organic monolayers were characterized using a variety of spectroscopic methods. Monolayer formation, morphology, and stability will be presented with important implications for electronic measurements obtained from organic monolayer test structures.
Christina A. Hacker
Semiconductor Electronics Division
Electronics and Electrical Engineering Laboratory
Building 225, Room B326
Mail Stop: 8120
Telephone: (301) 975-2233
Fax: (301) 975-8069
Sigma Xi Member: Yes