Peel test revisited using novel high throughput methods
Arnaud Chiche, Wenhua Zhang, Christopher M. Stafford
National Institute of Standards and Technology, Gaithersburg, MD, USA
Phone: (301) 975 3586 — arnaud.chiche@nist.gov
Abstract
We have developed a novel combinatorial method for peel
testing based on the use of gradient techniques, including surface roughness
and energy, adhesive or backing layer thickness, and sample annealing temperature.
The experimental design provides us with a high throughput map of peel
force and energy as a function of geometric and energetic parameters. These
are often overlooked in peel testing, despite their importance in defining
the adhesive-adherent contact and the local stress distribution, which
have recently been shown as control parameters of the debonding mechanisms
in tack tests. We identified and characterized the peel mechanisms relevant
to a model pressure sensitive adhesive (PSA). This class of adhesives,
widely used industrially, exhibits remarkable viscoelasticity and ability
to sustain large deformations.
NIST - Polymers Division
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