Development of quantitative electric force microscopy for surface and subsurface characterization of nanostructures in polymeric materials
Minhua Zhao, Xiaohong Gu, Tinh Nguyen
Polymeric Materials Group, National Institute of Standards & Technology
100 Bureau Dr, MS 8615, Gaithersburg, MD 20899
Electric Force Microscopy (EFM) [1], a variant of Atomic Force Microscopy (AFM), is based on long-range electrostatic interactions between the probe and sample, which can measure local electrical properties including surface potential and dielectric constant with nanoscale spatial resolution. However, the broad application of EFM technique in polymeric materials is limited by its current qualitative status. In this study, quantitative EFM characterization on nanostructured polymer films and carbon nanotubes dispersed in polymer nanocomposites is developed by the use of custom-made high-aspect-ratio AFM probes under controlled humidity conditions in conjunction with the analytical models. Advantages of quantitative EFM imaging relative to the widely used AFM phase imaging techniques are highlighted. We anticipate that quantitative EFM technique will be a valuable tool for surface and subsurface characterization of nanostructures in polymer materials, with a broad range of applications in nanotechnology.
[1] Zhao, M.H., et al., Ultrasharp and high aspect ratio carbon nanotube atomic force microscopy probes for enhanced surface potential imaging. Nanotechnology, 2008. 19(23).
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Category: Materials
Name: Minhua Zhao
Mentor’s name: Tinh Nguyen
Division: Materials and Construction Research
Laboratory: BFRL
Room/Building: B358/226
Mail Stop: 8615
Telephone #: 301-975-8923
Fax #: 301-990-6891
Email: minhua.zhao@nist.gov
Sigma Xi: Yes
Is your mentor a Sigma Xi Member? No