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Semiconductors Programs & Projects

(showing 16 - 24 of 24)
Back-End-of-Line Reliability Metrology Development
Last Updated Date: 09/26/2014

The Back-End-of-Line (BEOL) Reliability Metrology Development project aims to develop the metrology to enable quantitative and mechanistic … more

Thin Film Electronics
Last Updated Date: 09/23/2014

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

COMPLETED: Dimensional Metrology for Nanoscale Patterns
Last Updated Date: 04/17/2014

Our goal is to develop and demonstrate precise measurement methods that quantify the physical shape, critical dimensions (CD) and the structure of … more

Super-resolution Optical Microscopy
Last Updated Date: 03/24/2014

As the electronics and data storage industries build devices on ever decreasing scales, they need advanced imaging techniques that allow them to … more

Smart Grid System Testbed Facility
Last Updated Date: 01/24/2014

NIST is charged by the 2007 Energy Independence and Security Act (EISA) with facilitation of interoperability standards to enable successful … more

Power Conditioning Systems for Renewables, Storage, and Microgrids
Last Updated Date: 01/24/2014

The introduction of variable renewables, storage and microgrids into today’s electrical grid requires conversion of electric power from one form … more

Theory of Transport in Graphene
Last Updated Date: 03/21/2013

Graphene, a single layer of carbon atoms, is one of the most likely materials to produce the next breakthrough in the electronics industry.  Ideal … more

Thin Film X-Ray Reflectometry
Last Updated Date: 10/09/2012

Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to … more

Nanocalorimetry
Last Updated Date: 10/01/2012

Nanocalorimetry using micromachined devices has the capability to provide quantitative data to support the development of advanced metal silicide … more

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