Semiconductors Programs & Projects | |
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Plasma Process Metrology
Last Updated Date: 10/01/2012 Our multifaceted program provides numerous outputs to assist our customers. First, we develop and evaluate a variety of measurement techniques … more
Nanocalorimetry
Last Updated Date: 10/01/2012 Nanocalorimetry using micromachined devices has the capability to provide quantitative data to support the development of advanced metal silicide … more
Semiconductor Metrology for Energy Conversion
Last Updated Date: 08/21/2012 Optical Materials Metrology 21st century optoelectronics emphasizes energy technologies, and modern security issues have heightened needs for … more
Novel Sources for Focused-ion Beams
Last Updated Date: 08/14/2012 Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. At the CNST, researchers … more
Advanced Magnetic and Quantum Materials
Last Updated Date: 12/15/2011 Quantum coherent materials have become important in magnetic sensors as well as information processing technology. For magnetic sensors, … more
Nanostructure Fabrication and Metrology
Last Updated Date: 11/07/2011 Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or … more
Super-resolution Optical Microscopy
Last Updated Date: 10/05/2010 As the electronics and data storage industries build devices on ever decreasing scales, they need advanced imaging techniques that allow them to … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |