Semiconductors News | |
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Noise Measurement May Boost Cell Phone Performance
Release Date: 06/22/2006 Researchers at the National Institute of Standards and Technology (NIST) and industry collaborators have developed improved methods for accurately … more
Growing Glowing Nanowires to Light Up the Nanoworld
Release Date: 05/25/2006 NIST "grows" semiconductor nanowires that emit ultraviolet light as part of a project to make prototype nano-lasers and other … more
Simulation Program Predicts Resistivity in Nanodevices
Release Date: 01/17/2006 As nanoscale circuits continue to shrink, electrical resistivity increases in the wiring and limits the maximum circuit speed. A new simulation … more
NIST Team Reports Method to Characterize New Insulating Materials for Microelectronics
Release Date: 08/20/2002 Researchers from the Commerce Department's National Institute of Standards and Technology (NIST) reported today they have developed methods … more
Public/Private Advance Focuses the Search for New Materials to Print Next-Generation Microchips
Release Date: 07/19/2002 New methods reported today by researchers from the Commerce Department's National Institute of Standards and Technology (NIST) , the IBM T.J. … more
New e-Handbook of Statistical Methods Available Online from NIST
Release Date: 06/15/2002 The Commerce Department's National Institute of Standards and Technology (NIST) and International SEMATECH (ISMT) announced today the new … more |
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