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New Quantum Dot Transistor Counts Individual Photons
Release Date: 10/11/2007

A transistor containing quantum dots that can count individual photons (the smallest particles of light) has been designed and demonstrated at the … more

NIST Releases New Standard for Semiconductor Industry
Release Date: 10/12/2006

A wide range of optical electronic devices, from laser disk players to traffic lights, may be improved in the future thanks to a small piece of … more

Stress Management: X-Rays Reveal Si Thin-Film Defects
Release Date: 07/06/2006

X-ray topographs of three different strata of a strained-silicon wafer show close correspondence in defects from the base silicon layer (top) … more

Noise Measurement May Boost Cell Phone Performance
Release Date: 06/22/2006

Researchers at the National Institute of Standards and Technology (NIST) and industry collaborators have developed improved methods for accurately … more

Growing Glowing Nanowires to Light Up the Nanoworld
Release Date: 05/25/2006

  NIST "grows" semiconductor nanowires that emit ultraviolet light as part of a project to make prototype nano-lasers and other devices and the … more

Simulation Program Predicts Resistivity in Nanodevices
Release Date: 01/17/2006

As nanoscale circuits continue to shrink, electrical resistivity increases in the wiring and limits the maximum circuit speed. A new simulation … more

NIST Team Reports Method to Characterize New Insulating Materials for Microelectronics
Release Date: 08/20/2002

Researchers from the Commerce Department's National Institute of Standards and Technology (NIST) reported today they have developed methods for … more

Public/Private Advance Focuses the Search for New Materials to Print Next-Generation Microchips
Release Date: 07/19/2002

New methods reported today by researchers from the Commerce Department's National Institute of Standards and Technology (NIST) , the IBM T.J. … more

New e-Handbook of Statistical Methods Available Online from NIST
Release Date: 06/15/2002

The Commerce Department's National Institute of Standards and Technology (NIST) and International SEMATECH (ISMT) announced today the new … more

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