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Semiconductors News

(showing 46 - 60 of 64)
Cracking a Tough Nut for the Semiconductor Industry
Release Date: 12/23/2008

Researchers at the National Institute of Standards and Technology (NIST) have developed a method to measure the toughness—the resistance to … more

Neutron Researchers Discover Widely Sought Property in Magnetic Semiconductor
Release Date: 11/25/2008

Researchers working at the National Institute of Standards and Technology (NIST) have demonstrated for the first time the existence of a key … more

NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
Release Date: 11/25/2008

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of … more

Cold Atoms Could Replace Hot Gallium in Focused Ion Beams
Release Date: 11/12/2008

Scientists at the National Institute of Standards and Technology (NIST) have developed a radical new method of focusing a stream of ions into a … more

‘Electron Trapping’ May Impact Future Microelectronics Measurements
Release Date: 06/24/2008

Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, researchers at the National Institute of … more

Exposing the Sensitivity of Extreme Ultraviolet Photoresists
Release Date: 06/24/2008

Researchers at the National Institute of Standards and Technology (NIST) have confirmed that the photoresists used in next-generation … more

Learn About 'NIST and Nanosoccer' from New Web Site and Video
Release Date: 05/28/2008

If you love soccer but don’t want to wait until the next World Cup in 2010 to satisfy your appetite for the most popular game on Earth, the … more

NIST Team Proves Bridge from Conventional to Molecular Electronics Possible
Release Date: 03/18/2008

Researchers at the National Institute of Standards and Technology (NIST) have set the stage for building the “evolutionary link” between the … more

Good Vibrations Probe Innards of Molecular Electronic Junctions
Release Date: 03/05/2008

Using an unusual spectroscopic technique, researchers at the National Institute of Standards and Technology (NIST) have provided the most … more

Measurement Innovations Add Up to Big Savings for Semiconductors
Release Date: 01/08/2008

A new report* from the National Institute of Standards and Technology (NIST) shows that investment in measurement science has and will continue to … more

New Quantum Dot Transistor Counts Individual Photons
Release Date: 10/11/2007

A transistor containing quantum dots that can count individual photons (the smallest particles of light) has been designed and demonstrated at the … more

NIST Releases New Standard for Semiconductor Industry
Release Date: 10/12/2006

A wide range of optical electronic devices, from laser disk players to traffic lights, may be improved in the future thanks to a small piece of … more

Stress Management: X-Rays Reveal Si Thin-Film Defects
Release Date: 07/06/2006

X-ray topographs of three different strata of a strained-silicon wafer show close correspondence in defects from the base silicon layer (top) … more

Noise Measurement May Boost Cell Phone Performance
Release Date: 06/22/2006

Researchers at the National Institute of Standards and Technology (NIST) and industry collaborators have developed improved methods for accurately … more

Growing Glowing Nanowires to Light Up the Nanoworld
Release Date: 05/25/2006

  NIST "grows" semiconductor nanowires that emit ultraviolet light as part of a project to make prototype nano-lasers and other devices and the … more

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