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Semiconductors News

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Hankering for Molecular Electronics? Grab the New NIST Sandwich
Release Date: 08/25/2009

The flip-chip lamination method creates an ultra-smooth gold surface (left), which allows the organic molecules to form a thin yet even layer … more

Novel Temperature Calibration Improves NIST Microhotplate Technology
Release Date: 08/11/2009

Researchers at the National Institute of Standards and Technology (NIST) have developed a new calibration technique that will improve the … more

Memory with a Twist: NIST Develops a Flexible Memristor
Release Date: 06/02/2009

Electronic memory chips may soon gain the ability to bend and twist as a result of work by engineers at the National Institute of Standards and … more

NIST Engineers Discover Fundamental Flaw in Transistor Noise Theory
Release Date: 05/20/2009

Pacemakers, like the implanted one shown in this image, are among the low-power devices that could be affected by new NIST findings about … more

Conference Offers Insight Into Exploration of Nano-sized Electronics
Release Date: 04/21/2009

New methods for exploring the behavior of the high-performance electronics materials and devices that will shape the future of the electronics … more

Conference to Focus on Anti-Counterfeiting, Consumer Protection
Release Date: 02/10/2009

Representatives from business and government agencies concerned with intellectual property rights, particularly those concerning electronic … more

Cracking a Tough Nut for the Semiconductor Industry
Release Date: 12/23/2008

Researchers at the National Institute of Standards and Technology (NIST) have developed a method to measure the toughness—the resistance to … more

Neutron Researchers Discover Widely Sought Property in Magnetic Semiconductor
Release Date: 11/25/2008

Researchers working at the National Institute of Standards and Technology (NIST) have demonstrated for the first time the existence of a key … more

NIST ‘Stress Tests’ Probe Nanoscale Strains in Materials
Release Date: 11/25/2008

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of … more

Cold Atoms Could Replace Hot Gallium in Focused Ion Beams
Release Date: 11/12/2008

Scientists at the National Institute of Standards and Technology (NIST) have developed a radical new method of focusing a stream of ions into a … more

‘Electron Trapping’ May Impact Future Microelectronics Measurements
Release Date: 06/24/2008

Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, researchers at the National Institute of … more

Exposing the Sensitivity of Extreme Ultraviolet Photoresists
Release Date: 06/24/2008

Researchers at the National Institute of Standards and Technology (NIST) have confirmed that the photoresists used in next-generation … more

Learn About 'NIST and Nanosoccer' from New Web Site and Video
Release Date: 05/28/2008

If you love soccer but don’t want to wait until the next World Cup in 2010 to satisfy your appetite for the most popular game on Earth, the … more

NIST Team Proves Bridge from Conventional to Molecular Electronics Possible
Release Date: 03/18/2008

Researchers at the National Institute of Standards and Technology (NIST) have set the stage for building the “evolutionary link” between the … more

Good Vibrations Probe Innards of Molecular Electronic Junctions
Release Date: 03/05/2008

Using an unusual spectroscopic technique, researchers at the National Institute of Standards and Technology (NIST) have provided the most … more

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