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Semiconductors News

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Researchers Demonstrate and Explain Surface Conduction in a Topological Insulator
Release Date: 07/11/2012

Researchers at the University of Maryland and the NIST Center for Nanoscale Science and Technology have for the first time experimentally … more

Shaffique Adam Receives Singapore National Research Foundation Fellowship
Release Date: 06/27/2012

In July, Shaffique Adam will join the inaugural faculty of Yale-NUS College as an Assistant Professor of Science, with a joint appointment in the … more

NIST Announces $2.6 Million in Funding for Novel Semiconductor Research
Release Date: 03/20/2012

The National Institute of Standards and Technology (NIST) is soliciting proposals to support long-term research in next-generation semiconductor … more

NIST Reveals Switching Mechanism in Promising Computer Memory Device
Release Date: 02/21/2012

Sometimes knowing that a new technology works is not enough. You also must know why it works to get marketplace acceptance. New information from … more

Laying the Groundwork for 3D Stacked Integrated Circuits
Release Date: 02/17/2012

Graphical representation of a stack of individual chips connected by vertical pipelines or through-silicon vias (TSVs). Credit: IBM. Could … more

CNST and Sandia Researchers Publish a Detailed Review of Electrical Contacts in One and Two Dimensional Nanomaterials
Release Date: 02/15/2012

Researchers from the NIST Center for Nanoscale Science and Technology and Sandia National Laboratories have published a detailed review of recent … more

PML's Pernstich Develops Open-Source Software to Automate Test Equipment
Release Date: 02/06/2012

Graphical user interface of Instrument Control (iC). more

NIST Sensor Improvement Brings Analysis Method into Mainstream
Release Date: 12/20/2011

An advance in sensor design* by researchers at the National Institute of Standards and Technology (NIST) and the University of Waterloo's … more

PML Researchers Create Tool for 'Circuit-Aware' Reliability Testing
Release Date: 12/09/2011

High-speed, amplified probe tip used to collect reliability data in the NIST more

NIST Polishes Method for Creating Tiny Diamond Machines
Release Date: 09/27/2011

Diamonds may be best known as a symbol of long-lasting love. But semiconductor makers are also hoping they'll pan out as key components of … more

NIST, AIP to Make Semiconductor Research Freely Available Online
Release Date: 05/24/2011

A wealth of information on recent advances in semiconductor research is now available for free, thanks to an agreement between the National … more

NIST 'Nanowire' Measurements Could Improve Computer Memory
Release Date: 05/18/2011

In this schematic image (top) and transmission electron micrograph, a silicon nanowire is shown surrounded by a stack of thin layers of material … more

NIST Nanofluidic 'Multi-tool' Separates and Sizes Nanoparticles
Release Date: 08/03/2010

A wrench or a screwdriver of a single size is useful for some jobs, but for a more complicated project, you need a set of tools of different … more

Liposome-Hydrogel Hybrids: No Toil, No Trouble for Stronger Bubbles
Release Date: 06/09/2010

People have been combining materials to bring forth the best properties of both ever since copper and tin were merged to start the Bronze Age. In … more

Seeing Moiré in Graphene
Release Date: 04/27/2010

Researchers at the National Institute of Standards and Technology (NIST) and the Georgia Institute of Technology have demonstrated* that atomic … more

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