NIST logo
NIST Home > Semiconductors News 
 

Semiconductors News

(showing 1 - 15 of 64)
Improving CD-AFM Measurements from the Tip Down
Release Date: 03/31/2016

Figure 1. Scanning electron microscope image of the SCCDRM sample, displaying the pattern of near-vertical sidewalls with varying linewidths, high … more

Not So Fast: Overlooked Resistance May Inflate Estimates of Organic-Semiconductor Performance
Release Date: 03/10/2016

It’s hardly a character flaw, but organic transistors—the kind envisioned for a host of flexible electronics devices—behave less than ideally, or … more

Measuring Nanoscale Features with Fractions of Light
Release Date: 12/02/2015

National Institute of Standards and Technology (NIST) researchers are seeing the light, but in an altogether different way. And how they are doing … more

NIST and Intel Get Critical (Dimensions) with X-rays
Release Date: 10/20/2015

Researchers from the National Institute of Standards and Technology (NIST) and Intel reported* success using an X-ray scattering technique to … more

Interface Engineering Leads to Advances in Organic Spintronics
Release Date: 06/30/2015

Sujitra Pookpanratana applies the organic monolayers onto the cobalt surfaces to tune the magnetic properties of the Co-molecule interface. … more

Seeing 3D Shapes with SEM
Release Date: 04/27/2015

A three-dimensional reconstruction of chip features from measurements using the NIST model-library method. As microchip feature dimensions … more

NIST-Intel Partnership Workshop
Release Date: 12/03/2014

In November, 2014, NIST hosted the seventh in a series of workshops in a NIST-Intel partnership effort on Emerging Nanoscale Interface and … more

NIST Offers Electronics Industry Two Ways to Snoop on Self-Organizing Molecules
Release Date: 10/22/2014

A few short years ago, the idea of a practical manufacturing process based on getting molecules to organize themselves in useful nanoscale shapes … more

Scientists Shed Light on Organic Photovoltaic Characteristics
Release Date: 09/02/2014

Organic photovoltaic sample under test. (Click image to enlarge.) Photovoltaic devices, also kno more

PML Leadership Prominent Throughout Newly Released ITRS
Release Date: 04/24/2014

George Orji, PML's Semiconductor and Dimensional Metrology Division When the semiconductor industry received the eagerly awaited annual update of … more

MML Researcher R. Joseph Kline Receives Presidential Early Career Award for Scientists and Engineers
Release Date: 01/15/2014

Material Measurement Laboratory researcher R. Joseph Kline was recently named among the 102 recipients of the Presidential Early Career Awards for … more

NIST Chip Measurement Advance Earns 'Oscar of Innovation'
Release Date: 07/12/2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 … more

Microscopy Technique Could Help Computer Industry Develop 3-D Components
Release Date: 06/25/2013

A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has … more

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future
Release Date: 03/05/2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070