Semiconductors News | |
|
Nanoelectronics Conference Will Focus on Semiconductor Industry's Future
Release Date: 03/05/2013 How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 … more
NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012 A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more
September Workshop to Explore the Measurement Needs of the Flexible Electronics Industry
Release Date: 09/05/2012 The National Institute of Standards and Technology (NIST), in concert with the FlexTech Alliance, will hold a workshop on “Flexible … more
PML Uses Combined Optical Techniques to Provide Important Answers on Graphene Structures
Release Date: 08/13/2012 Nhan Nguyen demonstrates how he performs optical measurements on a graphene-insulator-semiconductor sample structure. That graphene is the hot new … more
Researchers Demonstrate and Explain Surface Conduction in a Topological Insulator
Release Date: 07/11/2012 Researchers at the University of Maryland and the NIST Center for Nanoscale Science and Technology have for the first time experimentally … more
Shaffique Adam Receives Singapore National Research Foundation Fellowship
Release Date: 06/27/2012 In July, Shaffique Adam will join the inaugural faculty of Yale-NUS College as an Assistant Professor of Science, with a joint appointment in the … more
NIST Announces $2.6 Million in Funding for Novel Semiconductor Research
Release Date: 03/20/2012 The National Institute of Standards and Technology (NIST) is soliciting proposals to support long-term research in next-generation semiconductor … more
NIST Reveals Switching Mechanism in Promising Computer Memory Device
Release Date: 02/21/2012 Sometimes knowing that a new technology works is not enough. You also must know why it works to get marketplace acceptance. New information from … more
Laying the Groundwork for 3D Stacked Integrated Circuits
Release Date: 02/17/2012 Graphical representation of a stack of individual chips connected by vertical pipelines or through-silicon vias (TSVs). Credit: IBM. Could … more
CNST and Sandia Researchers Publish a Detailed Review of Electrical Contacts in One and Two Dimensional Nanomaterials
Release Date: 02/15/2012 Researchers from the NIST Center for Nanoscale Science and Technology and Sandia National Laboratories have published a detailed review of recent … more
PML's Pernstich Develops Open-Source Software to Automate Test Equipment
Release Date: 02/06/2012
NIST Sensor Improvement Brings Analysis Method into Mainstream
Release Date: 12/20/2011 An advance in sensor design* by researchers at the National Institute of Standards and Technology (NIST) and the University of Waterloo's … more
NIST Polishes Method for Creating Tiny Diamond Machines
Release Date: 09/27/2011 Diamonds may be best known as a symbol of long-lasting love. But semiconductor makers are also hoping they'll pan out as key components of … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |
![]("/pml/div683/images/user_interface.jpg")
more
![]("/pml/div683/images/probe_small_web.jpg")
more