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C. R. Hagwood, W. F. Guthrie (to appear)
Combining Data in Small Multiple Method Studies
Technometrics
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C. R. Hagwood, W. F. Guthrie (2006)
Combining Data in Small Multiple Method Studies
Technometrics
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H. Liu, W. F. Guthrie, D. Malec, G. Yang (2004)
MCMC in StRD
Proceedings of the 2003 Quality and Productivity Conference
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H. H. Xu, S. Takagi, L. Sun, L. Hussain, L. C. Chow, W. F. Guthrie, J. H. Yen (2006)
Development of a nonrigid, durable calcium phosphate cement for use in periodontal bone repair
Journal of the American Dental Association, Vol. 137, pp.1131-1138
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C. F. Ferraris, W. F. Guthrie, I. Aviles, R. K. Haupt, B. S. MacDonald (2005)
Certification of SRM 114q: Phase I
NIST SP 161, 30 p.
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A. Hornikova, W. F. Guthrie (2005)
A Survey of Key Comparisons
Proceedings of the 2005 Measurement Science Conference, 12 p.
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R. A. Allen, A. Hunt, C. E. Murabito, B. Park, W. F. Guthrie, M. W. Cresswell (2005)
Extraction of Critical Dimension Reference Feature CDs from New Test Structure Using HRTEM Imaging
Proceedings of the International Conference on Microelectronic Test Structures (ICMTS)
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M. W. Cresswell, W. F. Guthrie, R. G. Dixson, R. A. Allen, C. E. Murabito, B. Park, J. V. Martinez de Pinillos (2005)
Single-Crystal Critical Dimension Prototype Reference Materials
NIST Report of Investigation for RM 8111, 27 p.
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M. W. Cresswell, R. G. Dixson, W. F. Guthrie, R. A. Allen, C. E. Murabito, B. Park, J. V. Martinez de Pinillos, A. Hunt (2005)
CD Reference Features with Sub-Five Nanometer Uncertainty
Proceedings of the International Society for Optical Engineering (SPIE), Microlithography 2005
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M. W. Cresswell, B. Park, R. A. Allen, W. F. Guthrie, R. G. Dixson, W. M. Tan, C. E. Murabito (2005)
Comparison of SEM and HRTEM CD Measurements Extracted from Test-Structures Having Feature Linewidths from 40 nm to 240 nm
Proceedings of the 2005 International Conference on Microelectronic Test Structures (ICMTS)
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R. A. Bryant, T. J. Ohlemiller, E. L. Johnsson, A. Hamins, B. S. Grove, W. F. Guthrie, A. Maranghides, G. W. Mulholland (2004)
NIST 3 Megawatt Quantitative Heat Release Rate Facility: Description and Procedures
NISTIR 7052, 130 p.
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Z. Q. Lu, W. F. Guthrie (2004)
Bayesian Methods for Statistical Inference on the Common Mean from Multiple Data Sources
Proceedings of ASPE 2004 Summer Topic Meeting - Uncertainty Analysis in Measurement and Design, pp 95-99.
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C. G. Simon, W. F. Guthrie, F. W. Wang (2004)
Cell Seeding into Calcium Phosphate Cement
Journal of Biomedical Materials Research, Volume 68A, pp 628-639.
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A. Hornikova, W. F. Guthrie (2004)
Troubleshooting Key Comparisons (A Survey of Design, Analysis, and Reporting of Results in Key Comparisons)
Proceedings of the 2004 Joint Statistical Meetings, pp 2021-2028.
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H. Liu, W. F. Guthrie, D. Malec, G. Yang (2004)
MCMC in StRD
Proceedings of the 2004 NCSL International Workshop and Symposium, Salt Lake City, UT, 10 p.
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R. A. Bryant, T. J. Ohlemiller, E. L. Johnsson, A. Hamins, B. S. Grove, W. F. Guthrie, A. Maranghides, G. W. Mulholland (2003)
NIST 3 Megawatt Quantitative Heat Release Rate Facility
NIST SP 1007, 81 p.
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C. M. Croarkin, P. Tobias, J. J. Filliben, B. Hembree, W. F. Guthrie, J. Prins, C. Zey, N. A. Heckert, L. Trutna (2003)
NIST/SEMATECH e-Handbook of Statistical Methods
NIST Handbook 151
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R. L. Paul, D. S. Simons, W. F. Guthrie, Z. Q. Lu (2003)
Radiochemical Neutron Activation Analysis for Certification of Ion-Implanted Phosphorus in Silicon
Anal. Chem., 75 (16), 4028 -4033, 2003
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G. C. Turk, L. L. Yu, M. L. Salit, W. F. Guthrie (2002)
Using Inductively Coupled Plasma-Mass Spectrometry for Calibration Transfer Between Environmental CRMs
Fresenius Journal of Analytical Chemistry, Volume 370, pp 259-263.
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W. F. Guthrie, B. W. Mangum, G. F. Strouse (2002)
Summary of Comparison of Realizations of the ITS-90 over the Range 83.8058 K to 933.473 K: CCT Key Comparisons 3
Metrologia, Volume 39, pp 179-205.
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W. F. Guthrie (2002)
Should (T1-T2) Have Larger Uncertainty Than T1?
Proceedings of the 8th International Conference on Temperature: Its Measurements and Control, Volume 2, pp. 887-892.
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M. Winchester, B. S. MacDonald, G. C. Turk, J. L. Mann, W. R. Kelly, W. F. Guthrie (2001)
An Alternative Method for the Certification of S Mass Fraction in Coal Standard Reference Materials
Fresenius Journal of Analytical Chemistry, Volume 370, pp 234-240
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W. F. Guthrie, M. VanLandingham, J. S. Villarrubia, L. Van Burren (2001)
Nanoindentation of Polymers: An Overview.
Advances in Scanning Probe Microscopy of Polymers. Macromolecular Symposia. Volume 167. Proceedings. 2001, Tsukruk, V. V.; Spencer, N. D., Editors, 15-44 pp, 2001.
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W. F. Guthrie, G. F. Banks, K. Eberhardt, L. Gill, M. Levenson, H. Liu, M. Vangel, J. H. Yen, N. Zhang (2000)
An Approach to Combining Results From Multiple Methods Motivated by the ISO GUM
Journal of Research of the National Institute of Standards and Technology, Volume 105, pp 571-579.
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W. F. Guthrie, M. W. Cresswell, M. W. Guillaume, W. E. Lee, R. A. Allen, R. Ghoshtagore, Z. E. Osborne, N. Sullivan, L. W. Linholm (2000)
Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors Replicated in Monocrystalline Films having Non-Planar Geometries
IEEE Transactions on Semiconductors Manufactoring, Volume 12, No. 2, pp 154-165.
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W. F. Guthrie, M. Levenson, R. G. Gann, K. D. Steckler, S. Ruitberg (2000)
Relative Ignition Propensity of Test Cigarettes
NIST Tech. Note 1436, 30 p.
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M. W. Cresswell, R. A. Allen, W. F. Guthrie, J. J. Sniegowski, R. Ghoshtagore, L. W. Linholm (1998)
Electrical Linewidth Test Structures Fabricated in Monocrystalline Films for Reference Material Applications
IEEE Transactions on Semiconductor Manufacturing, Vol. 11, No. 2, pp. 182-193.
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M. W. Cresswell, N. M. Guillaume, R. A. Allen, W. F. Guthrie, R. Ghoshtagore, J. C. Owen, Z. E. Osborne, N. Sullivan, L. W. Linholm (1998)
Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors Replicated in Monocrystalline Films having Non-Planar Geometries
Proceedings of the IEEE International Conference on Microelectronic Test Structures, pp. 29-38.
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S. Mayo, J. J. Kopanski, W. F. Guthrie (1998)
Intermittent-Contact Scanning Capacitance Microscopy Imaging and Modeling for Overlay Metrology
Characterization and Metrology for ULSI Technology, American Institute of Physics Conference Proceedings 449, pp. 567-572
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W. E. Lee, W. F. Guthrie, M. W. Cresswell, R. A. Allen, J. J. Sniegowski, L. W. Linholm (1997)
Reference-Length Shortening by Kelvin Voltage Taps in Linewidth Test Structures Replicated in Monocrystalline Silicon Films
Proceedings of the IEEE International Conference on Microelectronic Test Structures, Vol. 10, pp. 35-38.
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N. J. Carino, G. M. Mullings, W. F. Guthrie (1997)
Evaluation of ASTM Standard Consolidation Requirements for Preparing High-Strength Concrete
High Performance Concrete: Design and Materials and Recent Advances in Concrete Technology, , Proceedings of the International Conference on High-Performance Concrete, American Concrete Institute Special Publication 172, pp 733-768.
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M. W. Cresswell, J. J. Sniegowski, R. Ghoshtagore, R. A. Allen, W. F. Guthrie, L. W. Linholm (1997)
Electrical Linewidth Test Structures Fabricated in Monocrystalline Films for Reference Material Applications
Proceedings of the IEEE International Conference on Microelectronic Test Structures, Vol. 10, pp 16-24.
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M. W. Cresswell, J. J. Sniegowski, R. Ghoshtagore, R. A. Allen, W. F. Guthrie, A. W. Gurnell, L. W. Linholm, R. G. Dixson, E. C. Teague (1996)
Recent Developments in Electrical Linewidth and Overlay Metrology for Integrated Circuit Fabrication Processes
Japanese Journal of Applied Physics, Vol. 35, Part 1, No. 12B, pp 6597-6609.
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M. W. Cresswell, R. A. Allen, L. W. Linholm, W. F. Guthrie, A. W. Gurnell (1996)
Hybrid Optical-Electrical Overlay Test Structure
Proceedings of the IEEE International Conference on Microelectronic Test Structures, Vol. 9, pp. 9-12.
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M. A. Schen, F. I. Mopsik, W. Wu, W. E. Wallace, N. C. Beck-Tan, G. T. Davis, W. F. Guthrie (1996)
Advances in the Measurement of Polymer CTE: Micrometer to Atomic-Scale Measurements
Proceedings of the 211th American Chemical Society National Meeting, Division of Polymer Chemistry, Vol. 37, No. 1, pp 180-182.
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C. Lobo, W. F. Guthrie, R. N. Kacker (1995)
A Study on the Reuse of Plastic Concrete Using Extended Set-Retarding Admixtures
Journal of Research of the National Institute of Standards and Technology, Vol. 100, No. 5, 1995, pp. 575-589
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N. J. Carino, E. S. Lagergreen, W. F. Guthrie (1994)
Effects of Testing Variables on the Measured Compressive Strength of High-Strength (90 Mpa) Concrete
NISTIR 5405
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N. J. Carino, W. F. Guthrie, E. S. Lagergreen, G. M. Mullings (1994)
Effects of Testing Variables on the Strength of High-Strength (90 Mpa) Concrete Cylinders
High Performance Concrete, Proceedings of the International Conference on High Performance Concrete, American Concrete Institute Special Publication 149, pp. 589-632
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M. A. Schen, G. T. Davis, F. I. Mopsik, W. F. Guthrie, W. T. Chen, E. Livingston, L. Lee, W. Robbins, C. Lee, P. Henderson, M. L. Pecht, C. Y. Lee, J. Dion, e. al. (1994)
An Industry/Government/University Partnership: Measuring Sub-Micrometer Strain in Polymer Films
Proceedings of the IPC Printed Circuits Expo
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G. W. Burns, M. G. Scrogen, G. F. Strouse, C. M. Croarkin, W. F. Guthrie (1993)
Temperature Electromotive Force Reference Functions and Tables for the Letter-Designated Thermocouple Types Based on the ITS-90
National Institute of Standards and Technology Monograh 175, 270 p.
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G. W. Burns, G. F. Strouse, B. W. Magnum, C. M. Croarkin, W. F. Guthrie (1992)
New Reference Function for Platinum-10% Rhodium vs. Platinum (Type S) Thermocouples Based on the ITS-90, Parts I and II
Proceedings of the 7th International Symposium on Temperature, pp 537-546.
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G. W. Burns, G. F. Strouse, C. M. Croarkin, W. F. Guthrie, M. Chattle (1992)
New Reference Functions for Platinum-30% Rhodium vs. Platinum-6% Rhodium (Type B) and Platinum-13% Rhodium vs. Platinum (Type R) Thermocouples Based on the ITS-90
Proceedings of the 7th International Symposium on Temperature, pp 559-564.
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W. F. Guthrie, C. M. Croarkin, G. W. Burns, G. F. Strouse, e. al. (1992)
Statistical Analysis of Type S Thermocouple Measurements on the International Temperature Scale of 1990
Proceedings of the 7th International Symposium on Temperature, pp 547-552.
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Date created: 6/5/2001
Last updated: 05/16/2008
Please email comments on this WWW page to
alan.heckert@nist.gov.
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