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Topic Area: Law Enforcement
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Displaying records 41 to 50 of 62 records.
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41. DC Magnetic Force Microscopy of Thin Film Recording Heads
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5550
Topic: Law Enforcement
Published: 1/1/1994
Authors: Paul Rice, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30503

42. Epitaxial Growth and Characterization of the Ordered Vacancy Compound CuIn^d3^Se^d5^ ON GAAS (100) Fabricated by Molecular Beam Epitaxy
Topic: Law Enforcement
Published: 1/1/1994
Authors: A. J. Nelson, M Bode, G Borner, K Sinha, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30510

43. In Situ Observation of Surface Morphology of InP Grown on Singular and Vicinal (001) Substrates
Topic: Law Enforcement
Published: 1/1/1994
Authors: Kristine A Bertness, C Kramer, J M Olson, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30505

44. Progress towards Contact Mode Potentiometry
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5550
Topic: Law Enforcement
Published: 1/1/1994
Authors: John M Moreland, C Prater
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30507

45. Recent Results in Magnetic Force Microscopy
Topic: Law Enforcement
Published: 1/1/1994
Authors: A. Wadas, Paul Rice, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30508

46. Surface Modification of YBa^d2^Cu^d3^O^d7-{delta}^ Thin Films Using the Scanning Tunneling Microscope: Five Methods
Topic: Law Enforcement
Published: 1/1/1994
Authors: R. E. Thomson, John M Moreland, Alexana Roshko
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30504

47. Surface Topography and Ordering-Variant Segregation in GaInP^d2^
Topic: Law Enforcement
Published: 9/1/1993
Authors: D J Friedman, J G Zhu, A E Kibbler, J M Olson, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30519

48. Insulating Nanoparticles on YBa^d2^Cu^d3^O^d7-{delta}^ Thin Films Revealed by Comparison of Atomic Force and Scanning Tunneling Microscopy
Topic: Law Enforcement
Published: 8/1/1993
Authors: R. E. Thomson, John M Moreland, N. Missert, David A Rudman, Steven C Sanders, B F Cole
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30520

49. Scanned Probe Microscopy of YBa^d2^Cu^d3^O^dx^ Thin-Film Device Structures on Si Substrates
Topic: Law Enforcement
Published: 3/1/1993
Authors: John M Moreland, Todd E Harvey, Ronald H. Ono, Alexana Roshko
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30521

50. Magnetic Force Microscopy of Flux in Superconductors
Topic: Law Enforcement
Published: 1/1/1993
Authors: John M Moreland, Paul Rice, A. Wadas
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30516



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