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Displaying records 51 to 60 of 397 records.
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51. Carbon Nanomaterials Standards Efforts at NIST
Topic: Materials Science
Published: 5/24/0009
Author: Jeffrey A Fagan
Abstract: Development of carbon nano-materials for applications has been hindered to date by a lack of standard protocols, i.e. documentary standards, and physical standards such as reference materials, which enable the common inter-comparison between laborato ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901448

52. Challenges and Opportunities of Organic Electronics
Topic: Materials Science
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

53. Characterization of Airborne Nanoparticle Released from Consumer Products
Series: Technical Note (NIST TN)
Report Number: 1787
Topic: Materials Science
Published: 8/29/2013
Authors: Li Piin Sung, Joannie W Chin, Andrew Keith Persily
Abstract: This interim report summarizes research results to date under the FY2012 interagency agreement between CPSC and NIST to develop testing and measurement protocols for determining the quantities and properties of nanoparticles released from floorin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913002

54. Characterization of Standard Reference Material 2942, Ce-Ion-Doped Glass, Spectral Correction Standard for UV Fluorescence
Topic: Materials Science
Published: Date unknown
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2942 is a cuvette-shaped, Ce-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state fluorescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906188

55. Characterization of Surface Accumulation and Release of Nanosilica During Irradiation of Polymer Nanocomposites with Ultraviolet Light
Topic: Materials Science
Published: 8/12/2012
Authors: Tinh Nguyen, Bastien T. Pellegrin, Coralie Bernard, Savelas A Rabb, Paul E Stutzman, Justin M Gorham, Xiaohong Gu, Lee Lijian Yu, Joannie W Chin
Abstract: Nanofillers are increasingly used for enhancing multiple properties of polymeric materials in many applications. However, polymers are susceptible to photodegradation by solar ultraviolet (UV) radiation Therefore, nanofillers in a polymer nanocompos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909878

56. Characterization of Ternary Compounds in the BaO:Fe^d2^O^d3^:TiO^d2^ System: Ba^d6^Fe^d45^Ti^d17^O^d106^ and BaFe^d11^Ti^d3^O^d23^
Topic: Materials Science
Published: 1/1/1999
Authors: Terrell A Vanderah, Winnie K Wong-Ng, B H. Toby, V. M. Browning, Robert D Shull, Richard G. Geyer, Robert S. Roth
Abstract: Single crystals of Ba^d6^Fe^d45^Ti^d17^O^d106^ and BaFe^d11^Ti^d3^O^d23^ were obtained as major and minor co-products, respectively, by slow-cooling an off-stoichiometric BaO:Fe^d2^O^d3^:TiO^d2^ melt. The former compound exhibits variable stoichiome ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850204

57. Characterization of polydopamine thin films deposited at short times by the autoxidation of dopamine
Topic: Materials Science
Published: 7/9/2013
Author: Rebecca A Zangmeister
Abstract: Current interest in melanin films derived from the autoxidation of dopamine stems from their use as a universal adhesion layer. Here we report chemical and physical characterization of polydopamine films deposited on gold surfaces from stirred basic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912380

58. Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry
Topic: Materials Science
Published: 2/14/2008
Authors: Kristopher Lavery, Vivek M Prabhu, Eric K Lin, Wen-Li Wu, Kwang-Woo Choi, Sushil K Satija, M Wormington
Abstract: Off-specular reflectivity, or diffuse scattering, probes the lateral compositional variations at surfaces and interfaces. Of particular interest is the characterization at buried interfaces for the form and amplitude of roughness. Recent advances i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852736

59. Characterizing Pattern Structures Using X-Ray Reflectivity
Topic: Materials Science
Published: 3/28/2008
Authors: Hae-Jeong Lee, Christopher L Soles, Hyun Wook Ro, Shuhui Kang, Eric K Lin, Alamgir Karim, Wen-Li Wu
Abstract: Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic patterns on a planar substrate. The EMA means that the density of the solid pattern and the sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852735

60. Characterizing and Fractionating Native Cellulose Nanofibers
Topic: Materials Science
Published: Date unknown
Authors: Iulia Alisa Sacui, Jeffrey W Gilman
Abstract: Cellulose nanofibers have good elastic modulus properties and can be used as nano-reinforcements in polymer composites. Native cellulose nanofibers from wood, Tunicate, and bacteria (Acetobacter xylium) were characterized by atomic force microscopy ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911027



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