NIST logo

Publications Portal

You searched on:
Topic Area: Materials Science
Sorted by: title

Displaying records 471 to 480 of 533 records.
Resort by: Date / Title


471. Technology Readiness Levels for Randomized Bin Picking, Performance Metrics for Intelligent Systems (PerMIS) 2012 Workshop, Special Session
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7876
Topic: Materials Science
Published: 9/4/2012
Authors: Jeremy A Marvel, Roger D. Eastman, Geraldine S Cheok, Kamel Shawki Saidi, Tsai Hong Hong, Elena R Messina, Bob Bollinger, Paul Evans, Joyce Guthrie, Eric Hershberger, Carlos Martinez, Karen McNamara, James Wells
Abstract: The special session on Technology Readiness Levels (TRLs) for Randomized Bin Picking was held during the morning session of the 2012 Performance Metrics for Intelligent Systems (PerMIS) workshop, 21 March, 2012. The stated objective of the speci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911415

472. Teeth: Among Nature's Most Durable Biocomposites
Topic: Materials Science
Published: 4/6/2010
Authors: Brian Ronald Lawn, James J. Lee, H Chai
Abstract: This paper addresses the durability of natural teeth from a materials perspective. Teeth are depicted as 'smart' biocomposites, highly resistant to cumulative deformation and fracture. Favorable morphological features of teeth at both mac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903579

473. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Topic: Materials Science
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860

474. Texture Plus
Topic: Materials Science
Published: 2/1/2001
Author: Mark D Vaudin
Abstract: TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained on a powder x-ray diffractometer. The required data include an x-ray theta-2theta scan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850426

475. The 2002 Materials Research Society (MRS) Fall Meeting report
Topic: Materials Science
Published: 10/17/2003
Author: Winnie K Wong-Ng
Abstract: Following tradition, the 2002 Materials Research Society (MRS) annual meeting again took place from in Boston Copely Plaza from December 1 to 6 (in the spacious Hynes Convention Center). Attending the Boston MRS Fall meeting, for many attendees, ha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850703

476. The 2003 Materials Research Society (MRS) Fall Meeting
Topic: Materials Science
Published: 9/22/2004
Author: Winnie K Wong-Ng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850799

477. The 2005 Materials Research Society (MRS) Fall Meeting
Topic: Materials Science
Published: 9/18/2006
Author: Winnie K Wong-Ng
Abstract: The 2005 Materials Research Society (MRS) Fall Meeting took place in the Hynes Convention Center and the Sheration Boston Hotel, starting the weekend following the Thanksgivings Holidays from November 27 to December 2. This large-scale meeting inclu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850929

478. The Biological Evidence Preservation Handbook: Best Practices for Evidence Handlers
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7928
Topic: Materials Science
Published: 4/23/2013
Authors: Susan M Ballou, Margaret C Kline, Mark David Stolorow, Melissa K Taylor, Shannan R Williams, Phylis S Bamberger, Burney Yvette, Larry Brown, Cynthia E. Jones, Ralph Keaton, William Kiley, Karen Thiessen, Gerry LaPorte, Joseph Latta, Linda E Ledray, Randy Nagy, Linda Schwind, Stephanie Stoiloff, Brian Ostrom
Abstract: The report of the Technical Working Group on Biological Evidence Preservation offers guidance for individuals involved in the collection, examination, tracking, packaging, storing, and disposition of biological evidence. This may include crime sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913699

479. The Economics of New-Technology Materials: A Case Study of FRP Bridge Decking
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5864
Topic: Materials Science
Published: 7/1/1996
Authors: M A Ehlen, Harold E. Marshall
Abstract: Many new materials are bing developed from polymers, metals, and ceramics. Industry is beginning to introduce some of these high-performance or new-technology materials in construction and manufacturing applications because the materials have advant ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907922

480. The Effect of Substrate Material on Silver Nanoparticle Antimicrobial Efficacy
Topic: Materials Science
Published: 12/1/2010
Authors: Benita Dair, Dave M. Saylor, T. Eric Cargal, Grace R. French, Kristen M. Kennedy, Rachel S. Casas, Jonathan E Guyer, James A Warren, Steven K. Pollack
Abstract: With the advent of Nanotechnology, silver nanoparticles increasingly are being used in coatings, especially in medical device applications, to capitalize on their antimicrobial properties. The increased antimicrobial efficacy of nanoparticulate silv ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903174



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series