NIST logo

Publications Portal

You searched on:
Topic Area: Materials Science
Sorted by: title

Displaying records 391 to 400 of 512 records.
Resort by: Date / Title


391. Revealing the Interphase in Polymer Nanocomposites
Topic: Materials Science
Published: 3/16/2011
Authors: Mauro Zammarano, Paul Hutsell Maupin, Li Piin Sung, Jeffrey W Gilman, Douglas Matthew Fox
Abstract: Morphological characterization of polymer nanocomposites is a fundamental challenge that is complicated by multiple length scales. Here, we report a technique for high-throughput monitoring of interphase and dispersion in polymer nanocomposites based ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906284

392. Reversible effect of strain on transport critical current in Bi^d2^Sr^d2^CaCu^d2^O^d8+{I}x{/I}^ superconducting wires: A modified descriptive strain model
Topic: Materials Science
Published: 12/5/2011
Authors: Najib Cheggour, Xifeng Lu, T G Holesinger, Theodore C Stauffer, J Jiang, Loren Frederick Goodrich
Abstract: A reversible strain effect on transport critical current {I}I{/I}^dc^ was found in Bi^d2^Sr^d2^CaCu^d2^O^d8+{I}x{/I}^ (Bi-2212) high-temperature superconducting round wires. {I}I{/I}^dc^ showed unambiguous reversibility at 4 K and 16 T up to an irrev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908512

393. Review of Research on the Ground Truth Systems for Evaluating Part Identification Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7926
Topic: Materials Science
Published: 4/23/2013
Authors: Afzal A Godil, Roger D. Eastman, Tsai Hong Hong
Abstract: In this report we discuss different types of potential ground-truth systems that could be used to test part identification systems for manufacturing assembly applications. We discuss four main ways of acquiring ground truth for evaluating part re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913579

394. Roadmap for Developing Measurement Science for Predicting the Service Life of Polymers Used in Photovoltaic (PV) Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7971
Topic: Materials Science
Published: 2/24/2014
Authors: Xiaohong Gu, Joannie W Chin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912832

395. RoboCupRescue Interleague Challenge 2009: Bridging the gap between Simulation and Reality
Topic: Materials Science
Published: 6/30/2010
Authors: Alexander Kleiner, Christopher Scrapper, Adam S Jacoff
Abstract: The RoboCupRescue initiative, represented by real-robot and simulation league, is designed to foster the research and development of innovative technologies and assistive capabilities to help responders mitigate an emergency response situation. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905775

396. Role of Nanoparticles in Life Cycle of Nanocomposites
Topic: Materials Science
Published: 6/15/2010
Authors: Xiaohong Gu, Guodong Chen, Minhua Zhao, Stephanie S Watson, Paul E Stutzman, Tinh Nguyen, Joannie W Chin, Jonathan W. Martin
Abstract: The objective of this study is to investigate the role of ZnO nanoparticles in the life cycle of a waterborne polyurethane (PU) nanocomposite during UV exposure. The effects of loadings and sizes of ZnO nanoparticles on photodegradation of ZnO/PU fil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905542

397. Roughness induced magnetic inhomogeneity in Co/Ni multilayers: Ferromagnetic resonance and switching properties in nanostructures.
Topic: Materials Science
Published: 11/10/2010
Authors: Justin M Shaw, Hans T. Nembach, Thomas J Silva
Abstract: We report on the effect roughness has on the magnetic properties of Co/Ni multilayers with perpendicular anisotropy. We can systematically vary the surface roughness and grain size by the variation in the Cu seed layer thickness. The roughness has ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906064

398. SEM Induced Shrinking of Solid State Nanopores for Single Molecule Detection
Topic: Materials Science
Published: 9/22/2011
Authors: Anmiv Prahbu, Kevin J Freedman, Joseph William Robertson, Zhorro Nikolov, John J Kasianowicz, MinJun Kim
Abstract: We have investigated the shrinkage of solid state nanopores by a scanning electron microscope and find the process to be reproducible and dependant beam parameters such as the accelerating voltage and electron flux. The shrinking phenomenon does ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907430

399. Sample-Angle Feedback for Diffraction Anomalous Fine-Structure Spectroscopy
Topic: Materials Science
Published: 5/1/1998
Authors: J O Cross, W Elam, V G Harris, J P Kirkland, Charles E. Bouldin, L B Sorensen
Abstract: Diffraction anomalous fine-structure (DAFS) experiments measure Bragg peak intensities as continuous functions of photon energy near a core-level excitation. Measuring the integrated intensity at each energy makes the experiments prohibitively slow, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850185

400. Second Symposium on Pendulum Impact Machines: Procedures and Specimens
Topic: Materials Science
Published: 8/1/2006
Authors: Thomas Allen Siewert, Christopher N McCowan, M. P. Manahan
Abstract: This publication consists primarily of the papers presented at the Second Symposium on Pendulum Impact Machines: Procedures and Specimens, sponsored by ASTM Committee E28 on Mechanical Testing and its Subcommittee E28.07 on Impact Testing. The Sympos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50248



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series