NIST logo

Publications Portal

You searched on: Topic Area: Materials Science Sorted by: title

Displaying records 381 to 390 of 396 records.
Resort by: Date / Title


381. Ultra-small-Angle X-ray Scattering ‹ X-ray Photon-Correlation Spectroscopy Studies of Incipient Structural Changes in Amorphous Calcium Phosphate Based Dental Composites
Topic: Materials Science
Published: 2/28/2012
Authors: Fan Zhang, Andrew John Allen, Lyle E Levine, Laura Espinal, Joseph M Antonucci, Drago Skrtic, Justin N.R. O'Donnell, Jan Ilavsky
Abstract: The local structural changes in amorphous calcium phosphate (ACP) based dental composites were studied upon heating using both static, bulk measurement techniques and recently developed ultra-small angle X-ray scattering ‹ X-ray photon correlation sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906876

382. Ultrathin Adhesives: Confinement Effect on Modulus
Topic: Materials Science
Published: 2/15/2009
Authors: Jessica M. Torres, Christopher M Stafford, Bryan D. Vogt
Abstract: In this work, we will employ this wrinkling metrology to extract the modulus of polymer thin films for a homologous series of poly(n-alkyl methacrylate)s. In particular, we take advantage of the decrease in Tg as the alkyl chain length increases for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900945

383. Unconventional structure-assisted optical manipulation of high-index nanowires in liquid crystals
Topic: Materials Science
Published: 3/20/2012
Authors: Kristine A Bertness, David Engstrom, Michael C. M. Varney, Martin Persson, Rahul P. Trivedi, Mattias Goksor, Ivan I. Smalyukh
Abstract: Stable optical trapping and manipulation of high-index particles in low-index host media is often impossible due to the dominance of scattering forces over gradient forces. Here we explore optical manipulation in liquid crystalline structured hos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910451

384. Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel Using Complimentary Atom Probe Tomography and Electron Microscopy
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Jeffrey W Sowards, James R Fekete
Abstract: We investigated the mechanical properties as a function of isothermal annealing in alloy A710 (HSLA-80) using combined atom probe tomography and transmission electron microscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915365

385. Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis
Topic: Materials Science
Published: 5/28/2013
Authors: Chukwudi Azubuike Okoro, Yaw S Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
Abstract: In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913332

386. Use of the Grand Canonical Transition-Matrix Monte Carlo Method to Model Gas Adsorption in Porous Materials
Topic: Materials Science
Published: 2/21/2013
Authors: Daniel W Siderius, Vincent K Shen
Abstract: We present grand canonical transition-matrix Monte Carlo (GC-TMMC) as an efficient method for simulating gas adsorption processes, with particular emphasis on subcritical gas adsorption in which capillary phase transitions are present. As in other a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912491

387. Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors
Topic: Materials Science
Published: 4/1/2012
Authors: Lyle E Levine, P. Geantil, B C. Larson, Jonathan Tischler, Michael E. Kassner, Wenjun Liu
Abstract: Dislocation structures in deformed metals produce broad, asymmetric diffraction line profiles. During analysis, these profiles are generally separated into two nearly symmetric subprofiles corresponding to dislocation cell walls and cell interiors. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909490

388. Variances of Cylinder Parameters Fitted to Range Data
Series: Journal of Research (NIST JRES)
Report Number: 117.015
Topic: Materials Science
Published: 9/26/2012
Author: Marek Franaszek
Abstract: Industrial pipelines are frequently scanned with 3D imaging systems (e.g., LADAR) and cylinders are fitted to the collected data. Then, the fitted as-built model is compared with the as-designed model. Meaningful comparison between the two models ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910321

389. Water based Polyurethane Graphene Oxide Nanocomposites
Topic: Materials Science
Published: 3/3/2010
Authors: Coralie Bernard, Tinh Nguyen, Bastien T. Pellegrin, Mat Celina, Alexander J. Shapiro, Deborah L Stanley, Kar T. Tan, Sungjin Park, R. S. Ruoff, Joannie W Chin
Abstract: Graphene oxides are potentially a new class of nanomaterial to enhance multifunctional properties of polymers because of their remarkable thermal conductivity, mechanical strength, and more importantly, low cost. The graphene oxides, produced by exfo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904994

390. Well Ordered Polymer Melts from Blends of Disordered Triblock Copolymer Surfactants and Functional Homopolymers
Topic: Materials Science
Published: 4/4/2008
Authors: Vijay Tirumala, Alvin Romang, Sumit Agarwal, Eric K Lin, J J. Watkins
Abstract: Here, we report that well ordered, processible polymer melts with periodic nanostructures can be obtained in bulk quantity by simple blending of commercially available triblock copolymer surfactants with a series of commodity homopolymers that select ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852721



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series