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Displaying records 361 to 370 of 420 records.
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361. Substrate Hybridization and Rippling of Graphene Evidenced by Near-Edge X-ray Absorption Fine Structure Spectroscopy
Topic: Materials Science
Published: 5/1/2010
Authors: Daniel A Fischer, V. J. Lee, Patrick S Lysaght, Sarbajit Banerjee
Abstract: Interfacial interactions at graphene/metal and graphene/dielectric interfaces are likely to profoundly influence the electronic structure of graphene. We present here the first angle-resolved near-edge X-ray absorption fine structure (NEXAFS) spectro ...

362. Superconducting nanowire single photon detectors fabricated from an amorphous Mo0.75Ge0.25 thin-film
Topic: Materials Science
Published: 7/15/2014
Authors: Varun Boehm Verma, Adriana Eleni Lita, Michael R Vissers, Francesco Marsili, David P Pappas, Richard P Mirin, Sae Woo Nam
Abstract: We present the characteristics of superconducting nanowire single photon detectors (SNSPDs) fabricated from amorphous Mo0.75Ge0.25 thin -films. Fabricated devices show a saturation of the internal detection efficiency at temperatures below 1 K, w ...

363. Surface Analysis and Materials Characterization for the Study of the Ceramic Tiles HRSI from the Space Shuttle Thermal Protective Systems
Topic: Materials Science
Published: 10/12/2014
Authors: Hanna Szczepanowska, Thomas B Renegar
Abstract: The orbital thermal management systems fall into two categories, ablative or reusable. The first type was successfully applied on the Apollo missions, the second was used on the Space Shuttle Orbiters. The ceramic High-temperature Reusable Surfac ...

364. Surface Energy/Chemistry Gradients for Block Copolymer Thin Film Studies
Topic: Materials Science
Published: 8/2/2010
Authors: Julie N. L. Albert, Michael J. Baney, Christopher M Stafford, Jennifer Y. Kelly, Thomas H Epps
Abstract: Development of self-assembling block copolymer materials for emerging nanotechnologies requires an understanding of how surface energy and chemistry affect thin film phase behavior. Gradient methods provide an effective route to explore the role of ...

365. Surface indentation arrays for high-throughput analysis of viscoelastic material properties
Topic: Materials Science
Published: 10/30/2009
Authors: Peter M. Johnson, Christopher M Stafford
Abstract: Viscoelastic relaxation processes factor into polymer performance and stability throughout an application lifetime. These relaxations are controlled by the polymer network structure and dynamics which occur at different orders of magnitude in time. ...

366. Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology.
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6864
Topic: Materials Science
Published: 1/1/2002
Authors: Chad R Snyder, J P. Looney, M P Casassa

367. Sustainability Performance of the NIST Net Zero Energy Residential Test Facility Relative to a Maryland Code Compliant Design
Series: Special Publication (NIST SP)
Report Number: 1187
Topic: Materials Science
Published: 3/30/2015
Authors: Joshua D Kneifel, Eric G O\'Rear
Abstract: The National Institute of Standards and Technology (NIST) received funding through the American Recovery and Reinvestment Act (ARRA) to construct a Net-Zero Energy Residential Test Facility (NZERTF). The initial goal of the NZERTF is to demonstra ...

368. Swelling of Ultrathin Molecular Layer-by-Layer Polyamide Water Desalination Membranes
Topic: Materials Science
Published: 9/30/2013
Authors: Edwin P Chan, Allison P Young, Jung-Hyun Lee, Christopher M Stafford
Abstract: The water vapor swelling behavior of ultrathin crosslinked aromatic polyamide films, synthesized via molecular layer-by-layer deposition, is characterized via specular X-ray reflectivity. The results show that these films expand only along the thickn ...

369. Synchrotron-Based Measurement of the Impact of Thermal Cycling on the Evolution of Stresses in Cu Through-Silicon Via
Topic: Materials Science
Published: 6/30/2014
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Ruqing Xu, Klaus Hummler, Yaw S Obeng
Abstract: One of the main causes of failure during the lifetime of microelectronics devices is their exposure to fluctuating temperatures. In this work, synchrotron-based X-ray micro-diffraction is used to study the evolution of stresses in copper through-sili ...

370. Synthesis and Electronic Properties of the Misfit Layered Compound [(PbSe)1.00]1[MoSe2]1
Topic: Materials Science
Published: 9/1/2010
Authors: Ian M. Anderson, Michael D. Anderson, Andrew A Herzing, Colby Heideman, Raimar Rostek, David C. Johnson
Abstract: An ultra-low thermal conductivity compound with the ideal formula [(PbSe)1.00]1[MoSe2]1 has been successfully crystallized across a range of compositions. The lattice parameters varied from 12.41 Å to 12.75 Å and the quality of the observed 00ℓ ...

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