Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Materials Science Sorted by: title

Displaying records 331 to 340 of 446 records.
Resort by: Date / Title


331. Pyrochlore Formation, Phase Relations, and Properties in the CaO-TiO2-(Nb,Ta)2O5 Systems
Topic: Materials Science
Published: 3/1/2007
Authors: Terrell Ann Vanderah, Robert S. Roth, Ian E. Grey, W G Mumme, P Bordet, J C Ninod
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854394

332. Quantifying Residual Stress in Nanoscale Thin Polymer Films via Surface Wrinkling
Topic: Materials Science
Published: 3/19/2009
Authors: Jun Y. Chung, Thomas Q. Chastek, Michael J Fasolka, Hyun Wook Ro, Christopher M Stafford
Abstract: Residual stress, a pervasive consequence of solid materials processing, is stress that remains in a material after external forces have been removed. In polymeric materials, residual stress results from processes, such as film formation, that force ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902640

333. Quantifying the Transport Properties of Thin Polymer Gels via an Indentation-Based Technique
Topic: Materials Science
Published: 8/28/2011
Authors: Edwin P Chan, Yuhang Hu, Peter M. Johnson, Zhigang Suo, Christopher M Stafford
Abstract: Recently, an indentation approach has been demonstrated to quantify the poroelastic relaxations of hydrogels. Although the approach has been demonstrated to quantify the transport properties of thick hydrogel materials, its relevance for thin hydrog ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908228

334. Quartz crystal microbalance for in-situ monitoring of laser cleaning of carbon nanotubes
Topic: Materials Science
Published: 8/1/2010
Authors: Katie Hurst, Abram Van Der Geest, Mark T. Lusk, Elisabeth Mansfield, John H Lehman
Abstract: Photochemical changes of single-walled carbon nanotubes (SWCNTs), graphite and amorphous carbon have been investigated with a quartz crystal microbalance (QCM). The method of in-situ measurements reduces our uncertainty that is attributable to enviro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903111

335. REFERENCE MATERIALS FOR RHEOMETERS AND THE FLOW TABLE
Topic: Materials Science
Published: 8/3/2009
Authors: Chiara F Ferraris, Zughuo Li, Mona Mohseni, Nicholas Franson
Abstract: Oil is the most used standard material for the calibration of rheometers. Other products are used to calibrate flow devices, i.e., the flow table is calibrated using a mixture of oil and silica powder. The oil is a Newtonian liquid while the oil-sili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902616

336. RESONANCE ENERGY TRANSFER AS A TOOL FOR PROBING INTERFACE FORMATION IN NANOCOMPOSITES
Topic: Materials Science
Published: 6/24/2012
Authors: Mauro Zammarano, Edward D. McCarthy, Douglas Matthew Fox, Paul Hutsell Maupin, Li Piin Sung, Yeon Seok Kim
Abstract: One of the most enduring problems in the evolution of science and technology using nanoscale materials is the characterization of their morphology in macroscopic systems.1 This involves spatial and orientation distribution, which may be multimodal an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911046

337. Raman Spectroscopy of n-Type and p-Type GaSb with Multiple Excitation Wavelengths
Topic: Materials Science
Published: 10/1/2007
Authors: James E Maslar, Wilbur Scott Hurst, C Wang
Abstract: The interpretation of Raman spectra of GaSb can be complicated by the presence of a so-called surface space-charge region (SSCR), resulting in an inhomogeneous near-surface Raman scattering environment. To fully interpret Raman spectra, it is i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902678

338. Rational synthesis and characterization of a new family of low thermal conductivity misfit layered compounds [(PbSe)0.99]m[(WSe2)]n
Topic: Materials Science
Published: 2/9/2010
Authors: Ian M. Anderson, Michael D. Anderson, Qiyin Lin, Mary Smeller, Colby L. Heideman, Paul Zschack, Mikio Koyano, Robert Kykyneshi, Douglas A. Keszler, David C Johnson
Abstract: We describe here a general synthesis approach for the preparation of new families of misfit layer compounds and demonstrate its effectiveness through the preparation of the first 64 members of the [(PbSe)0.99]m(WSe2)n family of compounds, where m and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903149

339. Reaction Mechanism Governing the Formation of 1,3-bis(diphenylphosphino)propane-protected Gold Nanoclusters
Topic: Materials Science
Published: 9/19/2011
Authors: Jeffrey W Hudgens, John M Pettibone, Thomas P Senftle, Ryan N. Bratton
Abstract: This report outlines the determination of a reaction mechanism that can be manipulated to develop directed syntheses of gold monolayer protected clusters (MPCs) prepared by the reduction of solutions containing 1,3-bis(diphenylphosphino)propane (L^u3 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909874

340. Reaction Network Governing Diphosphine-Protected Gold Nanocluster Formation from Nascent Cationic Platforms
Topic: Materials Science
Published: 2/16/2012
Authors: John M Pettibone, Jeffrey W Hudgens
Abstract: We identify the reaction network governing gold monolayer protected cluster (MPC) formation during the reduction of Au(PPh^d3^)Cl and L^u5^ (L^u5^ = 1,5-bis(diphenylphosphino)pentane) in solutions. UV-vis spectroscopy and electrospray ionization mass ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909879



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series