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1. Materials Science &Technology (MS&T) 2008 Conference & Exhibition
Topic: Materials Science
Published: 7/18/2008
Author: Winnie K Wong-Ng
Abstract: The Materials Science &Technology 2008 Conference & Exhibition took place in the David L. Lawrence Convention Center in Pittsburgh, Pennsylvania from October 5-9. The MS&T 2008 Conference was a great success, with a total more than 1000 papers prese ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900239

2. 2011 Solutions in Perception Challenge Performance Metrics and Results
Topic: Materials Science
Published: 3/22/2012
Authors: Jeremy A Marvel, Tsai Hong Hong, Elena R Messina
Abstract: The 2011 Solutions in Perception Challenge (SPC) presented an international collection of teams with the opportunity to develop algorithms that could positively identify and accurately locate in space an arbitrary collection of artifacts. Researchers ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910645

3. 3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM
Topic: Materials Science
Published: 10/21/2010
Authors: Andrew A Herzing, Lee J Richter, Ian M. Anderson
Abstract: The three-dimensional characterization of third generation photovoltaic device structures at the nanometer scale is essential to the development of efficient, reliable, and inexpensive solar cell technologies. Electron tomography is a powerful metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905254

4. A Coherent Approach for Interrogating Polybenzoxazole Fibers for Residual Phosphoric Acid
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7573
Topic: Materials Science
Published: 9/17/2009
Authors: Gale Antrus Holmes, Eun S. Park, Charles Martin Guttman, Kathleen M. Flynn, John R Sieber, Stephanie S Watson, Kirk D Rice
Abstract: Because of the premature failure of soft-body armor that contains the active fiber poly [(benzo-[1,2-d:5,4-d‰]-benzoxazole-2,6-diyl)-1,4-phenylene] (PBO), the Office of Law Enforcement Standards (OLES) at the National Institute of Standards and Techn ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902057

5. A Combined Fit of Total Scattering and Extended X-ray Absorption Fine Structure Data for Local-Structure Determination in Crystalline Materials
Topic: Materials Science
Published: 10/5/2009
Authors: Igor Levin, Victor Lvovich Krayzman, Joseph C Woicik, Terrell A Vanderah, M. G. Tucker, Thomas Proffen
Abstract: Reverse Monte Carlo (RMC) refinements of local structure using a simultaneous fit of x-ray/neutron total scattering and EXAFS data were developed to incorporate an explicit treatment of both single- and multiple-scattering contributions to EXAFS. T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902352

6. A Coupled Arc and Droplet Model of GMAW
Topic: Materials Science
Published: 1/8/2005
Authors: Timothy P Quinn, M Szanto, T Gilad, I Shai
Abstract: A model of gas metal arc welding was developed that solves the magneto-hydrodynamic equations for the flow and temperature fields of the molten electrode and the plasma simultaneously, to form a fully coupled model. A commercial finite element code ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851278

7. A Detailed Failure Analysis Examination of the Effect of Thermal Cycling on Cu TSV Reliability
Topic: Materials Science
Published: 1/1/2014
Authors: Chukwudi Azubuike Okoro, June Waiyin Lau, Yaw S Obeng, Klaus Hummler
Abstract: In this work, a detailed failure analysis of the physical root cause for the increase in electrical resistance and radio-frequency (RF) transmission coefficient of through-silicon via (TSV) daisy chain was investigated. Six different failure modes we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913115

8. A Fast, Simple Wafer-level Hall-Mobility Measurement Technique
Topic: Materials Science
Published: 10/21/2009
Authors: Liangchun Yu, Kin P Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P Campbell, Kuang Sheng
Abstract: Mobility is a good indicator of device reliability. High channel mobility is one of the biggest challenges especially in novel devices such as high-k based MOSFET, III-V devices and SiC power MOSFET etc. Accurate measurement of channel mobility is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905424

9. A METHODOLOGY FOR DETECTING RESIDUAL PHOSPHORIC ACID IN POLYBENZOXAZOLE FIBERS
Topic: Materials Science
Published: 11/24/2009
Authors: Eun S. Park, John R Sieber, Charles Martin Guttman, Kirk D Rice, Kathleen M. Flynn, Stephanie S Watson, Gale Antrus Holmes
Abstract: There is great interest in the degradation of ballistic fibers from exposure to sunlight and high humidity, because it directly affects the lives of people who use protective ballistic armor. However, to date, no mechanism has been found to explain ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902056

10. A Practical and Systematic Review of Weibull Statistics for Reporting Strengths of Dental Materials
Topic: Materials Science
Published: 9/11/2009
Authors: Janet Quinn, George David Quinn
Abstract: Objective: To review the history, theory and current applications of Weibull analysis sufficient to make informed decisions regarding practical use of the analysis in dental material strength testing. Data: References are made to examples in the eng ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901550



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