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You searched on: Topic Area: Materials Science Sorted by: date

Displaying records 51 to 60 of 446 records.
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51. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

52. Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel Using Complimentary Atom Probe Tomography and Electron Microscopy
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Jeffrey W Sowards, James R Fekete
Abstract: We investigated the mechanical properties as a function of isothermal annealing in alloy A710 (HSLA-80) using combined atom probe tomography and transmission electron microscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915365

53. Development of Low Carrier Density Graphene Devices
Topic: Materials Science
Published: 8/1/2014
Authors: Yanfei Yang, Lung-I Huang, David B Newell, Yasuhiro Fukuyama, Mariano A. Real, Randolph E Elmquist
Abstract: Epitaxial graphene on SiC(0001) is used to fabricate Hall bar structures for metrological applications with a fabrication process that has been developed to eliminate organic chemical contamination of the graphene. Before any lithographic patterning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915345

54. Nanoscale Imaging and Spectroscopy of Plasmonic Modes with the PTIR technique
Topic: Materials Science
Published: 8/1/2014
Authors: Aaron M. Katzenmeyer, Jungseok Chae, Richard J Kasica, Glenn E Holland, Basudev Lahiri, Andrea Centrone
Abstract: The collective oscillation of conduction electrons in plasmonic nanomaterials allows the coupling of propagating light waves with nanoscale volumes of matter (,hot spotsŠ) and allows engineering their optical response from the UV to THz as a function ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915202

55. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Materials Science
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

56. Safety and Performance Standard Developments for Automated Guided Vehicles
Topic: Materials Science
Published: 7/23/2014
Authors: Roger V Bostelman, Tsai Hong Hong, Roger D. Eastman
Abstract: The American National Standards Institute/Industrial Truck Standards Development Foundation (ANSI/ITSDF) B56.5 Safety Standard committee for automated guided vehicles (AGVs) has been considering several changes to improve the standard. Of interest t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915310

57. Superconducting nanowire single photon detectors fabricated from an amorphous Mo0.75Ge0.25 thin-film
Topic: Materials Science
Published: 7/15/2014
Authors: Varun Boehm Verma, Adriana E Lita, Michael R Vissers, Francesco Marsili, David P Pappas, Richard P Mirin, Sae Woo Nam
Abstract: We present the characteristics of superconducting nanowire single photon detectors (SNSPDs) fabricated from amorphous Mo0.75Ge0.25 thin -films. Fabricated devices show a saturation of the internal detection efficiency at temperatures below 1 K, w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915243

58. From atoms to steps: the microscopic origins of crystal growth.
Topic: Materials Science
Published: 7/1/2014
Authors: Paul N Patrone, T L Einstein, Dionisios Margetis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914829

59. Non-destructive Measurement of the Residual Stresses in Copper Through-Silicon Vias using Synchrotron Based Micro-beam X-ray Diffraction
Topic: Materials Science
Published: 7/1/2014
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Yaw S Obeng, Klaus Hummler, Ruqing Xu
Abstract: In this study, we report a new method for achieving depth resolved determination of the full stress tensor in buried Cu through-silicon vias (TSVs), using synchrotron based X-ray micro-diffraction technique. Two adjacent Cu TSVs were analyzed; on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915348

60. Synchrotron-Based Measurement of the Impact of Thermal Cycling on the Evolution of Stresses in Cu Through-Silicon Via
Topic: Materials Science
Published: 6/30/2014
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Ruqing Xu, Klaus Hummler, Yaw S Obeng
Abstract: One of the main causes of failure during the lifetime of microelectronics devices is their exposure to fluctuating temperatures. In this work, synchrotron-based X-ray micro-diffraction is used to study the evolution of stresses in copper through-sili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915982



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