Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Materials Science Sorted by: date

Displaying records 51 to 60 of 448 records.
Resort by: Date / Title


51. New AGV Capabilities are Safety Driven
Topic: Materials Science
Published: 9/3/2014
Authors: Roger V Bostelman, William P Shackleford
Abstract: Current automated guided vehicle (AGV) technology typically provides material handling flow along single or dual opposing-flow lanes in manufacturing and distribution facilities. An AGV stops for most any obstacle that may be in its path which then s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917359

52. Multiscale Correlative Measurements of Nanoparticles in Cells
Topic: Materials Science
Published: 8/26/2014
Authors: Aric Warner Sanders, Kavita M Jeerage, Cindi Schwartz, Alexandra E Curtin, Ann Chiaramonti Chiaramonti Debay
Abstract: Nanoparticles are emerging as invaluable tools in disease diagnosis, disease treatment and imaging contrast enhancement agents. The interactions of nanoparticles with host organisms are complex and affect biological systems over length scales that va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915572

53. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

54. Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel Using Complimentary Atom Probe Tomography and Electron Microscopy
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Jeffrey W Sowards, James R Fekete
Abstract: We investigated the mechanical properties as a function of isothermal annealing in alloy A710 (HSLA-80) using combined atom probe tomography and transmission electron microscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915365

55. Development of Low Carrier Density Graphene Devices
Topic: Materials Science
Published: 8/1/2014
Authors: Yanfei Yang, Lung-I Huang, David B Newell, Yasuhiro Fukuyama, Mariano A. Real, Randolph E Elmquist
Abstract: Epitaxial graphene on SiC(0001) is used to fabricate Hall bar structures for metrological applications with a fabrication process that has been developed to eliminate organic chemical contamination of the graphene. Before any lithographic patterning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915345

56. Nanoscale Imaging and Spectroscopy of Plasmonic Modes with the PTIR technique
Topic: Materials Science
Published: 8/1/2014
Authors: Aaron M. Katzenmeyer, Jungseok Chae, Richard J Kasica, Glenn E Holland, Basudev Lahiri, Andrea Centrone
Abstract: The collective oscillation of conduction electrons in plasmonic nanomaterials allows the coupling of propagating light waves with nanoscale volumes of matter (,hot spotsŠ) and allows engineering their optical response from the UV to THz as a function ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915202

57. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Materials Science
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian J Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

58. Safety and Performance Standard Developments for Automated Guided Vehicles
Topic: Materials Science
Published: 7/23/2014
Authors: Roger V Bostelman, Tsai Hong Hong, Roger D. Eastman
Abstract: The American National Standards Institute/Industrial Truck Standards Development Foundation (ANSI/ITSDF) B56.5 Safety Standard committee for automated guided vehicles (AGVs) has been considering several changes to improve the standard. Of interest t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915310

59. Superconducting nanowire single photon detectors fabricated from an amorphous Mo0.75Ge0.25 thin-film
Topic: Materials Science
Published: 7/15/2014
Authors: Varun Boehm Verma, Adriana E Lita, Michael R Vissers, Francesco Marsili, David P Pappas, Richard P Mirin, Sae Woo Nam
Abstract: We present the characteristics of superconducting nanowire single photon detectors (SNSPDs) fabricated from amorphous Mo0.75Ge0.25 thin -films. Fabricated devices show a saturation of the internal detection efficiency at temperatures below 1 K, w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915243

60. From atoms to steps: the microscopic origins of crystal growth.
Topic: Materials Science
Published: 7/1/2014
Authors: Paul N Patrone, T L Einstein, Dionisios Margetis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914829



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series