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Topic Area: Materials Science
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Displaying records 381 to 390 of 531 records.
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381. Energy Price Indices and Discount Factors for Life-Cycle Cost Analysis April 2008
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 85-3273-23
Topic: Materials Science
Published: 5/1/2008
Authors: Amy S. Rushing, Barbara C. Lippiatt
Abstract: This is the April 2008 edition of energy price indices and discount factors for performing life-cycle cost analyses of energy and water conservation and renewable energy projects in federal facilities. It will be effective from April 1, 2008 to March ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861558

382. Origin of Adhesion in Humid Air
Topic: Materials Science
Published: 4/18/2008
Authors: Doo-In Kim, Jaroslaw Grobelny, Pradeep Narayanan Namboodiri, Robert Francis Cook
Abstract: The origin of adhesion at nanoscale contacts in humid air is investigated by pull-off force measurements using atomic force microscopes in controlled environments from ultra-high vacuum through various humidity conditions to water. An equivalent work ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851021

383. Effect of Ionic Substitution on the Structure and Dielectric Properties of Hafnia: A First Principles Study
Topic: Materials Science
Published: 4/15/2008
Author: Eric J Cockayne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854413

384. Well Ordered Polymer Melts from Blends of Disordered Triblock Copolymer Surfactants and Functional Homopolymers
Topic: Materials Science
Published: 4/4/2008
Authors: Vijay Tirumala, Alvin Romang, Sumit Agarwal, Eric K Lin, J J. Watkins
Abstract: Here, we report that well ordered, processible polymer melts with periodic nanostructures can be obtained in bulk quantity by simple blending of commercially available triblock copolymer surfactants with a series of commodity homopolymers that select ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852721

385. Determination of B-cation Chemical Short-Range Order in Perovskites from the Total Pair-Distribution Function
Topic: Materials Science
Published: 4/1/2008
Author: Victor Lvovich Krayzman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854405

386. HYDROGEN PIPELINE RESEARCH AT NIST
Topic: Materials Science
Published: 3/31/2008
Authors: Thomas Allen Siewert, Joseph David McColskey, Angelique N Lasseigne
Abstract: In 2007, the National Institute of Standards and Technology greatly expanded its efforts in support of the use of hydrogen as a fuel.   Various NIST divisions have started projects on measurement needs in the areas of flow rates, storage, mater ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853598

387. Characterizing Pattern Structures Using X-Ray Reflectivity
Topic: Materials Science
Published: 3/28/2008
Authors: Hae-Jeong Lee, Christopher L Soles, Hyun W. Ro, Shuhui Kang, Eric K Lin, Alamgir Karim, Wen-Li Wu
Abstract: Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic patterns on a planar substrate. The EMA means that the density of the solid pattern and the sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852735

388. Nanoimprint Lithography for the Direct Patterning of Nanoporous Interlayer Dielectric Insulator Materials
Topic: Materials Science
Published: 3/28/2008
Authors: Hyun W. Ro, Hae-Jeong Lee, Eric K Lin, Alamgir Karim, Daniel R. Hines, Do Y. Yoon, Christopher L Soles
Abstract: Directly patterning dielectric insulator materials for semiconductor devices via nanoimprint lithography has the potential to simplify fabrication processes and reduce manufacturing costs. However, the prospect of mechanically forming these material ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852733

389. Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry
Topic: Materials Science
Published: 2/14/2008
Authors: Kristopher Lavery, Vivek M Prabhu, Eric K Lin, Wen-Li Wu, Kwang-Woo Choi, Sushil K. Satija, M Wormington
Abstract: Off-specular reflectivity, or diffuse scattering, probes the lateral compositional variations at surfaces and interfaces. Of particular interest is the characterization at buried interfaces for the form and amplitude of roughness. Recent advances i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852736

390. In Situ Ultra-Small-Angle X-Ray Scattering Study of the Solution-Mediated Formation and Growth of Nanocrystalline Ceria
Topic: Materials Science
Published: 1/16/2008
Authors: Andrew John Allen, Vincent A Hackley, P R Jemian, Jan Ilavsky, J M Raitano, S W Chan
Abstract: A remote-controlled isothermal circulating fluid flow cell is described and results presented for the in situ ultra-small-angle x-ray scattering (USAXS) study of solution-mediated systems and suspensions. The fluid flow prevents settling out of coars ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850995



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