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Displaying records 331 to 340 of 396 records.
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331. Mechanically Robust Spin-On Organosilicates Glasses for Nanoporous Applications
Topic: Materials Science
Published: 2/7/2007
Authors: Hyun Wook Ro, K Char, Eun-Chae Jeon, H C Kim, Dongil Kwon, Hae-Jeong Lee, J. H. Lee, Hee-Woo Rhee, Christopher L Soles, Do Y. Yoon
Abstract: An increasing number of technologies demand nanoporous materials with vastly improved physical, mechanical and thermal properties. This manuscript develops the microstructural basis for synthesizing organosilicate glasses (OSGs) with unprecedented ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852621

332. Chemical Analysis of HfO22/ Si (100) Film Systems Exposed to NH3 Thermal Processing
Topic: Materials Science
Published: 1/15/2007
Authors: Patrick S Lysaght, Joseph C Woicik, Daniel A Fischer, G K Bersuker, Joel Barnett, Brendan Foran, H {?}H Tseng, Raj Jammy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854228

333. An Analytical Approach to Cost-Effective, Risk-Based Budgeting for Federal Information System Security
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7385
Topic: Materials Science
Published: 1/1/2007
Authors: Barbara C. Lippiatt, Sieglinde K. Fuller
Abstract: The purpose of this report is to identify and illustrate an approach to simplify and strengthen capital planning for information system security in compliance with federal policy and guidance. The report provides the theoretical underpinnings of a me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907292

334. Effects of Vacancies on the Properties of Disordered Ferroelectrics: A First-Principles Study
Topic: Materials Science
Published: 1/1/2007
Authors: L Bellaiche, Jorge Iniguez, Eric J Cockayne, Benjamin P Burton
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854310

335. In Situ Characterization of Gas-Phase Species Present During Hafnium Oxide Atomic Layer Deposition
Topic: Materials Science
Published: 1/1/2007
Authors: James E Maslar, Wilbur Scott Hurst, Donald R Burgess Jr., William Andrew Kimes, Nhan V Nguyen
Abstract: In this work, the species present in the gas phase during atomic layer deposition of hafnium oxide were investigated in an attempt to gain insight into the chemistry of this system. Hafnium oxide was deposited on a silicon substrate using tetrakis(e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830716

336. Phase Formation and Properties in the Magnetic Dielectric System Bi2O 3:2CoO 1+x::Nb2 O5
Topic: Materials Science
Published: 12/4/2006
Authors: Terrell A Vanderah, T Siegrist, M W. Lufaso, C Yeager, Juan C Nino, S Yates
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854233

337. Effects of Local Atomic Order on the Pre-Edge Structure in the Ti K-Absorption Spectra of Perovskite Solid Solutions CaTil-xZrxO3
Topic: Materials Science
Published: 12/1/2006
Authors: Victor Lvovich Krayzman, Joseph C Woicik, D Yoder, Daniel A Fischer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854321

338. Subsolidus Phase Equilibria and Properties in the Magnetic Dielectric System Bi2O3:Mn2O3+x:Nb2O5
Topic: Materials Science
Published: 11/1/2006
Authors: Terrell A Vanderah, M W. Lufaso, A U Adler, Juan C Nino, Virgil Provenzano, Peter K. Schenck, Robert S. Roth
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854224

339. Nanoparticle Lithography and Imaging Scanning Probe Microscopy
Topic: Materials Science
Published: 10/1/2006
Authors: Jaroslaw Grobelny, De-Hao D. Tsai, Doo-In Kim, Pradeep Narayanan Namboodiri, Robert Francis Cook, Michael Russel Zachariah
Abstract: Scanning tunnelling microscopy (STM) imaging was performed on goldsurfaces with a large coverage of monodispersed silver nanoparticlessoft-landed on the surface from the gas phase. In both ambient and ultra-highvacuum conditions, STM scanning was fou ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850977

340. NIST Recommended Practice Guide: Fractography of Ceramics and Glasses
Series: Special Publication (NIST SP)
Report Number: 960-16
Topic: Materials Science
Published: 9/26/2006
Author: George David Quinn
Abstract: Fractography is a powerful but underutilized tool for the analysis of fractured glasses and ceramics. Fractography can identify the cause of failure and can even provide quantitative information about the loading conditions. The goal of this Guide ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850928



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