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Displaying records 331 to 340 of 420 records.
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331. Effect of Ionic Substitution on the Structure and Dielectric Properties of Hafnia: A First Principles Study
Topic: Materials Science
Published: 4/15/2008
Author: Eric J Cockayne

332. Well Ordered Polymer Melts from Blends of Disordered Triblock Copolymer Surfactants and Functional Homopolymers
Topic: Materials Science
Published: 4/4/2008
Authors: Vijay Tirumala, Alvin Romang, Sumit Agarwal, Eric K Lin, J J. Watkins
Abstract: Here, we report that well ordered, processible polymer melts with periodic nanostructures can be obtained in bulk quantity by simple blending of commercially available triblock copolymer surfactants with a series of commodity homopolymers that select ...

333. Determination of B-cation Chemical Short-Range Order in Perovskites from the Total Pair-Distribution Function
Topic: Materials Science
Published: 4/1/2008
Author: Victor Lvovich Krayzman

Topic: Materials Science
Published: 3/31/2008
Authors: Thomas A. (Thomas A.) Siewert, Joseph David McColskey, Angelique N Lasseigne
Abstract: In 2007, the National Institute of Standards and Technology greatly expanded its efforts in support of the use of hydrogen as a fuel.   Various NIST divisions have started projects on measurement needs in the areas of flow rates, storage, mater ...

335. Characterizing Pattern Structures Using X-Ray Reflectivity
Topic: Materials Science
Published: 3/28/2008
Authors: Hae-Jeong Lee, Christopher Soles, Hyun Wook Ro, Shuhui Kang, Eric K Lin, Alamgir Karim, Wen-Li Wu
Abstract: Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic patterns on a planar substrate. The EMA means that the density of the solid pattern and the sp ...

336. Nanoimprint Lithography for the Direct Patterning of Nanoporous Interlayer Dielectric Insulator Materials
Topic: Materials Science
Published: 3/28/2008
Authors: Hyun Wook Ro, Hae-Jeong Lee, Eric K Lin, Alamgir Karim, Daniel R. Hines, Do Y. Yoon, Christopher Soles
Abstract: Directly patterning dielectric insulator materials for semiconductor devices via nanoimprint lithography has the potential to simplify fabrication processes and reduce manufacturing costs. However, the prospect of mechanically forming these material ...

337. Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry
Topic: Materials Science
Published: 2/14/2008
Authors: Kristopher Lavery, Vivek M Prabhu, Eric K Lin, Wen-Li Wu, Kwang-Woo Choi, Sushil K. Satija, M Wormington
Abstract: Off-specular reflectivity, or diffuse scattering, probes the lateral compositional variations at surfaces and interfaces. Of particular interest is the characterization at buried interfaces for the form and amplitude of roughness. Recent advances i ...

338. In Situ Ultra-Small-Angle X-Ray Scattering Study of the Solution-Mediated Formation and Growth of Nanocrystalline Ceria
Topic: Materials Science
Published: 1/16/2008
Authors: Andrew John Allen, Vincent A Hackley, P R Jemian, Jan Ilavsky, J M Raitano, S W Chan
Abstract: A remote-controlled isothermal circulating fluid flow cell is described and results presented for the in situ ultra-small-angle x-ray scattering (USAXS) study of solution-mediated systems and suspensions. The fluid flow prevents settling out of coars ...

Topic: Materials Science
Published: 11/16/2007
Authors: Thomas A. (Thomas A.) Siewert, Ivan Samard¿i¿,, Zvonimir Kolumbi
Abstract: This paper describes the application of an on-line monitoring system for the monitoring, aquisition and processing of key welding parameters. The on-line monitoring system has been successfully applied in practice to measure key welding parameters fo ...

340. Chemical Bonding and Many-Body Effects in Site-Specific X-ray Photoelectron Spectra of Corundum V2O3
Topic: Materials Science
Published: 10/1/2007
Authors: Joseph C Woicik, M Yekutiel, E J. Nelson, N Jacobson, P Pfalzer, L Kronik

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