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Displaying records 321 to 330 of 391 records.
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321. X-Ray Standing Wave Analysis of Overlayer Induced Substrate Relaxation: The Clean and Bi-covered (110) GaP Surface
Topic: Materials Science
Published: 4/1/2007
Authors: A Herrera-Gomez, Joseph C Woicik, T Kendelewicz, K E Miyano, W E Spicer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854331

322. Influence of Oxygen Vacancies on the Dielectric Properties of Hafnia
Topic: Materials Science
Published: 3/1/2007
Author: Eric J Cockayne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854316

323. Pyrochlore Formation, Phase Relations, and Properties in the CaO-TiO2-(Nb,Ta)2O5 Systems
Topic: Materials Science
Published: 3/1/2007
Authors: Terrell A Vanderah, Robert S. Roth, Ian E. Grey, W G Mumme, P Bordet, J C Ninod
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854394

324. Interrogation of 'Surface', 'Skin' and 'Core' Orientation in Thermotropic Liquid-Crystalline Copolyester Moldings by Near-Edge X-Ray Absorption Fine Structure and Wide-Angle X-Ray Scattering
Topic: Materials Science
Published: 2/26/2007
Authors: S Rendon, Robert A Bubeck, L S Thomas, W R Burghardt, A Hexemer, Daniel A Fischer
Abstract: Injection molding of thermotropic liquid-crystalline polymers (TLCPs) can result in molded articles the exhibit complex orientation states that vary considerably as a function of depth in the part. Skin-core morphologies are often observed in TLCP ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851047

325. Local Structure of Displacively-Disordered Pyrochlore Dielectrics
Topic: Materials Science
Published: 2/20/2007
Authors: Victor Lvovich Krayzman, Joseph C Woicik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854320

326. Mechanically Robust Spin-On Organosilicates Glasses for Nanoporous Applications
Topic: Materials Science
Published: 2/7/2007
Authors: Hyun Wook Ro, K Char, Eun-Chae Jeon, H C Kim, Dongil Kwon, Hae-Jeong Lee, J. H. Lee, Hee-Woo Rhee, Christopher L Soles, Do Y. Yoon
Abstract: An increasing number of technologies demand nanoporous materials with vastly improved physical, mechanical and thermal properties. This manuscript develops the microstructural basis for synthesizing organosilicate glasses (OSGs) with unprecedented ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852621

327. Chemical Analysis of HfO22/ Si (100) Film Systems Exposed to NH3 Thermal Processing
Topic: Materials Science
Published: 1/15/2007
Authors: Patrick S Lysaght, Joseph C Woicik, Daniel A Fischer, G K Bersuker, Joel Barnett, Brendan Foran, H {?}H Tseng, Raj Jammy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854228

328. An Analytical Approach to Cost-Effective, Risk-Based Budgeting for Federal Information System Security
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7385
Topic: Materials Science
Published: 1/1/2007
Authors: Barbara C. Lippiatt, Sieglinde K. Fuller
Abstract: The purpose of this report is to identify and illustrate an approach to simplify and strengthen capital planning for information system security in compliance with federal policy and guidance. The report provides the theoretical underpinnings of a me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907292

329. Effects of Vacancies on the Properties of Disordered Ferroelectrics: A First-Principles Study
Topic: Materials Science
Published: 1/1/2007
Authors: L Bellaiche, Jorge Iniguez, Eric J Cockayne, Benjamin P Burton
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854310

330. In Situ Characterization of Gas-Phase Species Present During Hafnium Oxide Atomic Layer Deposition
Topic: Materials Science
Published: 1/1/2007
Authors: James E Maslar, Wilbur Scott Hurst, Donald R Burgess Jr., William Andrew Kimes, Nhan V Nguyen
Abstract: In this work, the species present in the gas phase during atomic layer deposition of hafnium oxide were investigated in an attempt to gain insight into the chemistry of this system. Hafnium oxide was deposited on a silicon substrate using tetrakis(e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830716



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