NIST logo

Publications Portal

You searched on:
Topic Area: Materials Science
Sorted by: date

Displaying records 321 to 330 of 512 records.
Resort by: Date / Title


321. Modelling of Thermodynamics and Diffusion in Multicomponent Systems
Topic: Materials Science
Published: 4/1/2009
Authors: Ursula R Kattner, Carelyn E Campbell
Abstract: The availability of reliable materials data is key to the successful design of materials and manufacturing processes.  Commercial alloys rarely consist of only two or three elements, but rather may contain a large number of elements for which the nee ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853592

322. Hydrogen-Steel Compatibility Research at NIST-Boulder
Topic: Materials Science
Published: 3/30/2009
Author: Thomas Allen Siewert
Abstract: The NIST Materials Reliability Division is outfitting a high pressure (100 MPa) hydrogen testing facility to collect mechanical and thermodynamic property data on various candidate structural materials, and is developing data on nondestructive sens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902004

323. MULTI-DISCIPLINARY LIFE-CYCLE METRICS AND TOOLS FOR GREEN BUILDINGS* Prepared for the Multi-Discipline Life Cycle Assessment Projects special section in Integrated Environmental Assessment and Management
Topic: Materials Science
Published: 3/29/2009
Authors: Jennifer F Helgeson, Barbara C. Lippiatt
Abstract: Building sector stakeholders need compelling metrics, tools, data, and case studies supporting major investments in sustainable technologies. Proponents of green building widely claim that buildings integrating sustainable technologies are cost-effec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861595

324. Dielectric Spectroscopy Investigation of Relaxation in C60-Polyisoprene Nanocomposites
Topic: Materials Science
Published: 3/23/2009
Authors: Yifu Ding, Sebastian Pawlus, Alexei Sokolov, Jack F Douglas, Alamgir Karim, Christopher Soles
Abstract: We investigate the influence of adding C60 nanoparticles on the dielectric relaxation spectra of both unentangled and entangled polyisoprene (PIP). Relaxation modes corresponding to both segmental and chain relaxation were analyzed over a broad tempe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900194

325. Examination of thin film modulus for a series of poly(alkyl methacrylates)
Topic: Materials Science
Published: 3/22/2009
Authors: Jessica M. Torres, Christopher M Stafford, Bryan D. Vogt
Abstract: In this work, the modulus of polymer thin films for a homologous series of poly(n-alkyl methacrylate)s will be discussed. In particular, the impact of the degree of undercooling from bulk Tg on the deviations will be explored as Tg is significantly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900216

326. Patterns of Ensemble Variation of the Optical Properties of ZnO Nanowires Grown with Copper and Gold Catalysts
Topic: Materials Science
Published: 3/19/2009
Authors: Susie Eustis, Lawrence H Robins, Babak Nikoobakht
Abstract: Analysis of the structural and optical properties of gold- and copper-catalyzed zinc oxide (ZnO) nanowires (NWs), grown in a high temperature tube furnace on a sapphire substrate shows non-uniformity over the substrate. The changes in the optical pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832348

327. Quantifying Residual Stress in Nanoscale Thin Polymer Films via Surface Wrinkling
Topic: Materials Science
Published: 3/19/2009
Authors: Jun Y. Chung, Thomas Q. Chastek, Michael J Fasolka, Hyun W. Ro, Christopher M Stafford
Abstract: Residual stress, a pervasive consequence of solid materials processing, is stress that remains in a material after external forces have been removed. In polymeric materials, residual stress results from processes, such as film formation, that force ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902640

328. Measuring Photocatalytic Response of Metal Oxide Fillers in Polymeric Films Using Electron Paramagnetic Resonance Spectroscopy
Topic: Materials Science
Published: 3/18/2009
Authors: Stephanie S Watson, I-Hsiang Tseng
Abstract: Metal oxide fillers, such as titanium dioxide (TiO2), are heavily utilized in polymeric coatings and plastics for opacification, pigmentation, and mechanical enhancement. It is well known that the photoreactivity of TiO2 can contribute to the degrada ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902281

329. Polymerization Stress Development in Dental Composites: Effect of Cavity Design Factor
Topic: Materials Science
Published: 3/13/2009
Authors: Joseph M Antonucci, Anthony Albert Giuseppetti, Justin N.R. O'Donnell, Gary Edward Schumacher, Drago Skrtic
Abstract: Objective: To assess the effect of the cavity design factor (C-factor) on polymerization stress development (PSD) in resin composites. Methods: An experimental resin (BT resin) was prepared, which contained 2,2-bis[p-(2 hydroxy-3 -methacryloxypropoxy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900229

330. Structural Changes behind the Diffuse Dielectric Response in AgNbO3
Topic: Materials Science
Published: 3/13/2009
Authors: Igor Levin, Victor Lvovich Krayzman, Joseph C Woicik, J. Karapetrova, T. Proffen, M. G. Tucker, I. M. Reaney
Abstract: Structural changes among the so-called M-polymorphs of AgNbO3 were analyzed using combined high-resolution X-ray diffraction, neutron total scattering, electron diffraction, and X-ray absorption fine structure measurements. These polymorphs crystall ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901412



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series