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Displaying records 11 to 20 of 390 records.
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11. Proceedings of the Measurement Science for Sustainable Construction and Manufacturing Workshop: Volume 2. Presentations
Series: Grant/Contract Reports (NISTGCR)
Topic: Materials Science
Published: 9/26/2014
Authors: Bilal Ayyub, Gerald Galloway, Richard Wright
Abstract: This report documents the effort launched by the National Institute of Standards and Technology (NIST) to develop, organize, and convene a workshop on sustainability to promote the adoption and use of sustainable construction and manufacturing and gu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916764

12. Obstacle Detection and Avoidance from an Automated Guided Vehicle
Topic: Materials Science
Published: 9/18/2014
Authors: Roger V Bostelman, William P Shackleford, Geraldine S Cheok
Abstract: Current automated guided vehicle (AGV) technology typically provides material handling flow along single or dual opposing-flow lanes in manufacturing and distribution facilities. An AGV stops for most any obstacle that may be in its path which then ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915448

13. Multiscale Correlative Measurements of Nanoparticles in Cells
Topic: Materials Science
Published: 8/26/2014
Authors: Aric Warner Sanders, Kavita M Jeerage, Cindi Schwartz, Alexandra E Curtin, Ann Chiaramonti Chiaramonti Debay
Abstract: Nanoparticles are emerging as invaluable tools in disease diagnosis, disease treatment and imaging contrast enhancement agents. The interactions of nanoparticles with host organisms are complex and affect biological systems over length scales that va ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915572

14. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

15. Understanding the High-Temperature Mechanical Properties of A710 (HSLA-80) Steel Using Complimentary Atom Probe Tomography and Electron Microscopy
Topic: Materials Science
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Jeffrey W Sowards, James R Fekete
Abstract: We investigated the mechanical properties as a function of isothermal annealing in alloy A710 (HSLA-80) using combined atom probe tomography and transmission electron microscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915365

16. Development of Low Carrier Density Graphene Devices
Topic: Materials Science
Published: 8/1/2014
Authors: Yanfei Yang, Lung-I Huang, David B Newell, Yasuhiro Fukuyama, Mariano A. Real, Randolph E Elmquist
Abstract: Epitaxial graphene on SiC(0001) is used to fabricate Hall bar structures for metrological applications with a fabrication process that has been developed to eliminate organic chemical contamination of the graphene. Before any lithographic patterning ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915345

17. Nanoscale Imaging and Spectroscopy of Plasmonic Modes with the PTIR technique
Topic: Materials Science
Published: 8/1/2014
Authors: Aaron Michael Katzenmeyer, Jungseok Chae, Richard J Kasica, Glenn E Holland, Basudev Lahiri, Andrea Centrone
Abstract: The collective oscillation of conduction electrons in plasmonic nanomaterials allows the coupling of propagating light waves with nanoscale volumes of matter (,hot spotsŠ) and allows engineering their optical response from the UV to THz as a function ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915202

18. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Materials Science
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

19. From atoms to steps: the microscopic origins of crystal growth.
Topic: Materials Science
Published: 7/1/2014
Authors: Paul N. Patrone, T L Einstein, Dionisios Margetis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914829

20. Non-destructive Measurement of the Residual Stresses in Copper Through-Silicon Vias using Synchrotron Based Micro-beam X-ray Diffraction
Topic: Materials Science
Published: 7/1/2014
Authors: Chukwudi Azubuike Okoro, Lyle E Levine, Yaw S Obeng, Klaus Hummler, Ruqing Xu
Abstract: In this study, we report a new method for achieving depth resolved determination of the full stress tensor in buried Cu through-silicon vias (TSVs), using synchrotron based X-ray micro-diffraction technique. Two adjacent Cu TSVs were analyzed; on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915348



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