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Displaying records 61 to 70 of 391 records.
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61. Transmission EBSD in the Scanning Electron Microscope
Topic: Materials Science
Published: 5/1/2013
Authors: Roy Howard Geiss, Katherine P. Rice, Robert R Keller
Abstract: A new method for obtaining Kikuchi diffraction patterns from thin specimens in transmission has been developed for use in the SEM, scanning electron microscope, using a conventional electron backscatter diffraction (EBSD) detector and with a slight m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912886

62. Writing Guidelines for Requests for Proposals for Automated Fingerprint Identification Systems
Series: Special Publication (NIST SP)
Report Number: 1155
Topic: Materials Science
Published: 4/25/2013
Authors: Susan M Ballou, Michael D Garris, Anthony Clay, Joi Dickerson, Peter T Higgins, Janet Hoin, Lisa Jackson, Mike Lesko, Joe Morrissey, Leo Norton, Beth Owens, Joe Polski, Melissa K Taylor
Abstract: This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the id ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913324

63. The Biological Evidence Preservation Handbook: Best Practices for Evidence Handlers
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7928
Topic: Materials Science
Published: 4/23/2013
Authors: Susan M Ballou, Margaret C Kline, Mark David Stolorow, Melissa K Taylor, Shannan Williams, Phylis S Bamberger, Burney Yvette, Larry Brown, Cynthia E. Jones, Ralph Keaton, William Kiley, Karen Thiessen, Gerry LaPorte, Joseph Latta, Linda E Ledray, Randy Nagy, Linda Schwind, Stephanie Stoiloff, Brian Ostrom
Abstract: The report of the Technical Working Group on Biological Evidence Preservation offers guidance for individuals involved in the collection, examination, tracking, packaging, storing, and disposition of biological evidence. This may include crime sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913699

64. Development of a Reference Material for the Calibration of Cement Paste Rheometers
Topic: Materials Science
Published: 4/22/2013
Authors: Chiara F Ferraris, Paul E Stutzman, Zhuguo Li, Min-Hong Zhang
Abstract: Rheometers are usually calibrated using a standard reference oil. On the other hand the calibration of rheometer for paste or concrete cannot be calibrated using an oil as it is a Newtonian fluid, while the rheometers are designed to measure non-Newt ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907619

65. Effect of Surface Chemistry on Stem Cell Response in 2-D vs. 3-D Cell Culture Niches
Topic: Materials Science
Published: 4/19/2013
Authors: Sumona Sarkar, Carl George Simon Jr., Roberta I Lock, Joy P Dunkers
Abstract: To develop tissue engineered devices for regenerative medicine strategies, key scaffold properties for directing stem cell response must be identified. As focus shifts from 2-D to 3-D culture systems in an attempt to better recapitulate the na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912888

66. Spin transport parameters in metallic multilayers determined by ferromagnetic resonance measurements of spin-pumping
Topic: Materials Science
Published: 4/19/2013
Authors: Carl Thomas Boone, Hans Toya Nembach, Justin M Shaw, Thomas J Silva
Abstract: We measured spin-transport in nonferromagnetic (NM) metallic multilayers from the contribution to damping due to spin pumping from a ferromagnetic Co^d90^Fe^d10^ thin film. The multilayer stack consisted of NM^d1^/NM^d2^/Co^d90^Fe^d10^(2 nm)/NM^d2^/N ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912988

67. Determining Mechanical Reliability of Brittle Materials
Topic: Materials Science
Published: 4/18/2013
Authors: Stephen W. Freiman, Jeffrey T Fong
Abstract: The widespread existence of slow crack growth in most glasses and ceramics due to a stress-enhanced reaction between an external environment and strained bonds at a crack tip greatly complicates the challenge of assuring the reliability of components ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910158

68. The evaluation of photo/e-beam complementary grayscale lithography for high topography 3D structure
Topic: Materials Science
Published: 3/29/2013
Authors: Liya Yu, Richard J Kasica, Robert Dennis Newby, Lei Chen, Vincent K Luciani
Abstract: This article demonstrates and evaluates photo/e-beam grayscale complementary lithography processes for the fabrication of large area, high topography grayscale structure. The combination of these two techniques capitalizes on the capability of photol ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913677

69. Integrating carbon nanotubes as vias in a monolithic 3DIC process
Topic: Materials Science
Published: 3/21/2013
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, R. Ishihara, Johan van der Cingel , Kees Beenakker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911494

70. Towards the Integration of Carbon Nanotubes as Vias in Monolithic 3D Integrated Circuits
Topic: Materials Science
Published: 3/21/2013
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Johan van der Cingel , Kees Beenakker, R. Ishihara
Abstract: Carbon nanotubes (CNT) can be an attractive candidate for vertical interconnects (vias) in 3D integrated circuits due to their excellent thermal and electrical properties. To investigate CNT electrical resistivity, test vias were fabricated using b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912413



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