NIST logo

Publications Portal

You searched on: Topic Area: Materials Science

Displaying records 391 to 396.
Resort by: Date / Title


391. Characterization of Standard Reference Material 2942, Ce-Ion-Doped Glass, Spectral Correction Standard for UV Fluorescence
Topic: Materials Science
Published: Date unknown
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2942 is a cuvette-shaped, Ce-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state fluorescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906188

392. Characterizing and Fractionating Native Cellulose Nanofibers
Topic: Materials Science
Published: Date unknown
Authors: Iulia Alisa Sacui, Jeffrey W Gilman
Abstract: Cellulose nanofibers have good elastic modulus properties and can be used as nano-reinforcements in polymer composites. Native cellulose nanofibers from wood, Tunicate, and bacteria (Acetobacter xylium) were characterized by atomic force microscopy ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911027

393. Development of Multicolor Flow Cytometry Standards: Assignment of Equivalent Reference Fluorophores (ERF) Unit
Series: Journal of Research (NIST JRES)
Topic: Materials Science
Published: Date unknown
Authors: Lili Wang, Adolfas Kastytis Gaigalas
Abstract: A procedure is described for assigning values of the number of equivalent reference fluorophores (ERF) to microspheres labeled with a fluorophore designed to produce fluorescence in a given channel of a multicolor flow cytometer. There is a different ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906632

394. In situ Mapping and Characterization of Biodegradable Polymers within Soil Bacteria using Surface-Enhanced Micro-Raman Spectroscopy
Topic: Materials Science
Published: Date unknown
Authors: Santanu S. Kundu, Michael S. (Michael Stephan) Waters, Irene G. Calizo, Angela R Hight Walker, Kathryn L Beers
Abstract: Several species of environmental bacteria can be optimized to produce commercially harvestable biodegradable polymers (e.g. polyhydroxyalkanoates), and to degrade pollutants (e.g. halogenated aromatic compounds). Polyhydroxyalkanoates (PHAs) are incr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909817

395. Origins of enhanced capacity retention in copolymerized sulfur - based composite cathodes for high-energy density Li-S batteries
Topic: Materials Science
Published: Date unknown
Authors: Vladimir Pavlovich Oleshko, Jenny J. Kim, Jennifer Lyn Schaefer, Steven D Hudson, Christopher L Soles, Adam Simmonds, Jared Griebel, Kookheon Char, Jeff Pyun
Abstract: Poly(sulfur-random-(1,3-diisopropenylbenzene) (poly(S-r-DIB)) copolymers synthesized via inverse vulcanization form high molecular mass electrochemically active polymers capable of realizing enhanced capacity retention (1005 mAh/g at 100 cycles) and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917921

396. Carbon Nanomaterials Standards Efforts at NIST
Topic: Materials Science
Published: 5/24/0009
Author: Jeffrey A Fagan
Abstract: Development of carbon nano-materials for applications has been hindered to date by a lack of standard protocols, i.e. documentary standards, and physical standards such as reference materials, which enable the common inter-comparison between laborato ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901448



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series