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Topic Area: Materials Science

Displaying records 381 to 390 of 528 records.
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381. Well Ordered Polymer Melts from Blends of Disordered Triblock Copolymer Surfactants and Functional Homopolymers
Topic: Materials Science
Published: 4/4/2008
Authors: Vijay Tirumala, Alvin Romang, Sumit Agarwal, Eric K Lin, J J. Watkins
Abstract: Here, we report that well ordered, processible polymer melts with periodic nanostructures can be obtained in bulk quantity by simple blending of commercially available triblock copolymer surfactants with a series of commodity homopolymers that select ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852721

382. Determination of B-cation Chemical Short-Range Order in Perovskites from the Total Pair-Distribution Function
Topic: Materials Science
Published: 4/1/2008
Author: Victor Lvovich Krayzman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854405

383. HYDROGEN PIPELINE RESEARCH AT NIST
Topic: Materials Science
Published: 3/31/2008
Authors: Thomas Allen Siewert, Joseph David McColskey, Angelique N Lasseigne
Abstract: In 2007, the National Institute of Standards and Technology greatly expanded its efforts in support of the use of hydrogen as a fuel.   Various NIST divisions have started projects on measurement needs in the areas of flow rates, storage, mater ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853598

384. Characterizing Pattern Structures Using X-Ray Reflectivity
Topic: Materials Science
Published: 3/28/2008
Authors: Hae-Jeong Lee, Christopher L Soles, Hyun W. Ro, Shuhui Kang, Eric K Lin, Alamgir Karim, Wen-Li Wu
Abstract: Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic patterns on a planar substrate. The EMA means that the density of the solid pattern and the sp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852735

385. Nanoimprint Lithography for the Direct Patterning of Nanoporous Interlayer Dielectric Insulator Materials
Topic: Materials Science
Published: 3/28/2008
Authors: Hyun W. Ro, Hae-Jeong Lee, Eric K Lin, Alamgir Karim, Daniel R. Hines, Do Y. Yoon, Christopher L Soles
Abstract: Directly patterning dielectric insulator materials for semiconductor devices via nanoimprint lithography has the potential to simplify fabrication processes and reduce manufacturing costs. However, the prospect of mechanically forming these material ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852733

386. Characterization of the In-Plane Structure of Buried Interfaces by Off-Specular X-Ray and Neutron Reflectometry
Topic: Materials Science
Published: 2/14/2008
Authors: Kristopher Lavery, Vivek M Prabhu, Eric K Lin, Wen-Li Wu, Kwang-Woo Choi, Sushil K. Satija, M Wormington
Abstract: Off-specular reflectivity, or diffuse scattering, probes the lateral compositional variations at surfaces and interfaces. Of particular interest is the characterization at buried interfaces for the form and amplitude of roughness. Recent advances i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852736

387. In Situ Ultra-Small-Angle X-Ray Scattering Study of the Solution-Mediated Formation and Growth of Nanocrystalline Ceria
Topic: Materials Science
Published: 1/16/2008
Authors: Andrew John Allen, Vincent A Hackley, P R Jemian, Jan Ilavsky, J M Raitano, S W Chan
Abstract: A remote-controlled isothermal circulating fluid flow cell is described and results presented for the in situ ultra-small-angle x-ray scattering (USAXS) study of solution-mediated systems and suspensions. The fluid flow prevents settling out of coars ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850995

388. Dynamic Force Measurement: Instrumented Charpy Impact Testing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6652
Topic: Materials Science
Published: 1/1/2008
Authors: Christopher N McCowan, Jolene D Splett, E. Lucon
Abstract: The maximum forces measured by the machines in this round robin are in good agreement. This general result shows that the static force calibration of instrumented strikers is quite robust, and that the various striker designs evaluated here performed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50616

389. Fast automatic registration of range images from 3D imaging systems using sphere targets
Topic: Materials Science
Published: 1/1/2008
Authors: Marek Franaszek, Geraldine S Cheok, Christoph Johann Witzgall
Abstract: 3D imaging systems are line of sight instruments and multiple scans from different locations are often needed to get a good representation of an entire scene. Therefore, registration of different datasets to a common coordinate system is required. A ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860690

390. ON LINE MONITORING SYSTEM - AN APPLICATION FOR MONITORING KEY WELDING PARAMETERS OF DIFFERENT WELDING PROCESSES
Topic: Materials Science
Published: 11/16/2007
Authors: Thomas Allen Siewert, Ivan Samard¿i¿,, Zvonimir Kolumbi
Abstract: This paper describes the application of an on-line monitoring system for the monitoring, aquisition and processing of key welding parameters. The on-line monitoring system has been successfully applied in practice to measure key welding parameters fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50624



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