NIST logo

Publications Portal

You searched on: Topic Area: Materials Science

Displaying records 371 to 380 of 420 records.
Resort by: Date / Title

371. Transverse Fracture of Brittle Bilayers Relevance to Failure of All-Ceramic Dental Crowns
Topic: Materials Science
Published: 3/1/2006
Authors: Jeonghwan Kim, Sanjit Bhowmick, Ilja Hermann, Brian Ronald Lawn
Abstract: A study is made of the behavior of cracks approaching interfaces in all-ceramic crown-like bilayers. Flat specimens are fabricated by fusing porcelain veneers onto Y-TZP and alumina core ceramic plates, with veneer/core matching to minimize residual ...

372. Comparison of the Fouling Release Properties of Hydrophobic Fluorinated and Hydrophilic PEGylated Block Copolymer Surfaces
Topic: Materials Science
Published: 1/19/2006
Authors: S Krishman, N Wang, Christopher K. Ober, J Finlay, M E Callow, J A Callow, A Hexemer, K E Sohn, E J Kramer, Daniel A Fischer
Abstract: To understand the role of surface-wettability on adhesion of cells, the attachment of two different marine algae was studied on hydrophobic and hydrophilic polymer surfaces. Adhesion of cells of the diatom Navicula and sporelings (young plants) of th ...

373. Comparative Phase Equilibria in the Bi2O3-MOx-Nb2O5 Systems (MOx=Mn2O3, Fe2O3, Co3O4, ZnO)
Topic: Materials Science
Published: 11/23/2005
Authors: Terrell A Vanderah, M W. Lufaso, A U Adler, I M Pazos, S M Bell

374. Zeroing in on a Lead-Free Solder Database
Topic: Materials Science
Published: 10/1/2005
Authors: Thomas A. (Thomas A.) Siewert, David R. Smith
Abstract: The rising interest in lead-free solders creates a need for complete property data on the various lead-free solder compositions. Circuit designers need these data to assess the impact of the transition on product life, and production engineers need t ...

375. Impedance and Nonlinear Dielectric Testing at High AC Voltages Using Waveforms
Topic: Materials Science
Published: 8/15/2005
Authors: Jan Obrzut, K Kano
Abstract: This paper presents the application of a waveform technique that can determine the complex impedance and nonlinear response of dielectric composite films at high ac voltages using a data acquisition (DAQ) card and virtual instrumentation. The voltag ...

376. An Unexpected Crystal-Chemical Principle for the Pyrochlore Structure
Topic: Materials Science
Published: 7/18/2005
Authors: Terrell A Vanderah, M W. Lufaso

377. Analyzing Microstructure by Rietveld Refinement
Topic: Materials Science
Published: 6/1/2005
Authors: Davor Balzar, N C Popa
Abstract: Rietveld refinement has a primary purpose of refining crystal structure. However, this powerful technique is being increasingly used for obtaining microstructural information, such as texture, crystallite size, strain and stress, and crystalline defe ...

378. Site Specific X-Ray Photoelectron Spectroscopy Using X-Ray Standing Waves
Topic: Materials Science
Published: 5/26/2005
Author: Joseph C Woicik
Abstract: The x-ray standing wave technique is an experimental method that can accurately determine the precise crystallographic positions of atoms within a crystalline unit cell. As we have seen in preceding chapters of this book, this unique ability arises ...

379. Improvement in the Low Energy Collection Efficiency of Si(Li) X-Ray Detectors
Topic: Materials Science
Published: 4/7/2005
Authors: C E Cox, Daniel A Fischer, W G Schwarz, Y Song
Abstract: Soft X-ray beam-line applications are of fundamental importance to material research, and commonly employ high-resolution Si(Li) detectors for Energy Dispersive Spectroscopy. However, the measurement of X-rays below 1 keV compromised by absorption i ...

Topic: Materials Science
Published: 1/10/2005
Authors: Thomas A. (Thomas A.) Siewert, David R. Smith, Yi-Wen Cheng, Juan C Madeni, S X Liu
Abstract: The rising interest in lead-free solders creates a need for complete property data on the various lead-free solder compositions. Various types of data are available, but are widely dispersed through the literature. To improve the sharing of this impo ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series